Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Baderna, Davide"'
A compact low-cost test equipment for thermal and electrical characterization of integrated circuits
Publikováno v:
In Measurement February 2009 42(2):281-289
Publikováno v:
In Microelectronics Journal October 2006 37(10):1128-1135
Autor:
Baderna, Davide1, Cabrini, Alessandro1 alessandro.cabrini@unipv.it, Torelli, Guido1 guido.torelli@unipv.it
Publikováno v:
IEEE Transactions on Instrumentation & Measurement. Jun2006, Vol. 55 Issue 3, p754-760. 7p. 3 Black and White Photographs, 2 Diagrams, 2 Charts, 3 Graphs.
Publikováno v:
2008 IEEE International Symposium on Circuits & Systems; 2008, pix-xxviii, 20p
Publikováno v:
Proceedings of the 21st IEEE Instrumentation & Measurement Technology Conference (IEEE Cat. No.04CH37510); 2004, plxxii-xci, 20p