Mutation Sampling Technique for the Generation of Structural Test Data

Autor: Scholive, M., Beroulle, V., Robach, C., Flottes, M. L., Rouzeyre, B.

Publikováno v: Dans Design, Automation and Test in Europe - DATE'05, Munich : Allemagne (2005)

Our goal is to produce validation data that can be used as an efficient (pre) test set for structural stuck-at faults. In this paper, we detail an original test-oriented mutation sampling technique used for generating such data and we present a first

Externí odkaz: http://arxiv.org/abs/0710.4802

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Machine Learning and Hardware security: Challenges and Opportunities: Invited Talk

Autor: Regazzoni, F., Bhasin, S., Pour, A.A., Alshaer, I., Aydin, F., Aysu, A., Beroulle, V., Di Natale, G., Franzon, P., Hely, D., Homma, N., Ito, A., Jap, D., Kashyap, P., Polian, I., Potluri, S., Ueno, R., Vatajelu, E.-I., Yli-Mäyry, V.

Publikováno v: 2020 IEEE/ACM International Conference on Computer-Aided Design (ICADD): digest of technical papers : November 2-5, 2020: virtual conference
2020 IEEE/ACM International Conference on Computer-Aided Design (ICADD)

Machine learning techniques have significantly changed our lives. They helped improving our everyday routines, but they also demonstrated to be an extremely helpful tool for more advanced and complex applications. However, the implications of hardwar

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=narcis______::fe842b7c2fedb0dddad6a01281b776a6
https://dare.uva.nl/personal/pure/en/publications/machine-learning-and-hardware-security-challenges-and-opportunities(32ea7986-4687-4f44-ac21-8fdda252613c).html

Survey: Vulnerability Analysis of Low-Cost ECC-Based RFID Protocols against Wireless and Side-Channel Attacks.

Autor: Gabsi S; Electronic and Micro-Electronic Laboratory, Faculty of Sciences of Monastir, University of Monastir, Monastir 5019, Tunisia., Beroulle V; LCIS Laboratory, Grenoble INP, University Grenoble Alpes, 26000 Valence, France., Kieffer Y; LCIS Laboratory, Grenoble INP, University Grenoble Alpes, 26000 Valence, France., Dao HM; LCIS Laboratory, Grenoble INP, University Grenoble Alpes, 26000 Valence, France., Kortli Y; Electronic and Micro-Electronic Laboratory, Faculty of Sciences of Monastir, University of Monastir, Monastir 5019, Tunisia., Hamdi B; Electronic and Micro-Electronic Laboratory, Faculty of Sciences of Monastir, University of Monastir, Monastir 5019, Tunisia.

Publikováno v: Sensors (Basel, Switzerland) [Sensors (Basel)] 2021 Aug 30; Vol. 21 (17). Date of Electronic Publication: 2021 Aug 30.

Analysis of laser-induced errors: RTL fault model versus layout locality characteristics

Autor: Papadimitriou, A., Hély, D., Beroulle, V., Maistri, P., Leveugle, R.

Publikováno v: Third Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (TRUDEVICE'15)
Third Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (TRUDEVICE'15), Mar 2015, Grenoble, France

International audience; Laser attacks are an effective threat against secure integrated circuits, due to their capability to inject very precise hardware faults. Evaluation of such attacks at RTL provides to designers the means to increase the securi

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::244a24430a41bd3ffc9a2e863b15cd2c
https://hal.archives-ouvertes.fr/hal-01393406