Zobrazeno 1 - 10
of 12
pro vyhledávání: '"BA Bas Korevaar"'
Autor:
A.M.H.N. Petit, D. L. Williamson, C Chiel Smit, A Arjen Klaver, BA Bas Korevaar, van Racmm René Swaaij, van de Mcm Richard Sanden
Publikováno v:
Thin Solid Films, 491(1-2), 280-293. Elsevier
Hydrogenated microcrystalline silicon has been deposited at elevated deposition rates using an expanding thermal plasma for the decomposition of the precursor gas silane (SiH 4 ). An extensive survey of the influence of the deposition parameters on t
Publikováno v:
4th Semiconductor Advances for Future Electronics (SAFE 2001), 182-185
STARTPAGE=182;ENDPAGE=185;TITLE=4th Semiconductor Advances for Future Electronics (SAFE 2001)
Journal of Non-Crystalline Solids, 299-302(1), 98-102. Elsevier
STARTPAGE=182;ENDPAGE=185;TITLE=4th Semiconductor Advances for Future Electronics (SAFE 2001)
Journal of Non-Crystalline Solids, 299-302(1), 98-102. Elsevier
Microcrystalline silicon has been deposited using an expanding thermal plasma. High deposition rates are achieved, which is attractive for solar cell production. A first survey of the influence of the deposition parameters on the optical, electrical
Autor:
DC Daan Schram, van de Mcm Richard Sanden, Guy Adriaenssens, BA Bas Korevaar, Ahm Arno Smets, H.-Z. Song, Wmm Erwin Kessels
Publikováno v:
Journal of Non-Crystalline Solids, 266-269(1), 380-384. Elsevier
Time-of-flight measurements on hydrogenated amorphous silicon deposited with a remote expanding thermal plasma at growth rates up to 12 nm/s have revealed a 7 to 10 times larger hole mobility than for films deposited with conventional rf-PECVD. The e
Publikováno v:
Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002, 1230-1233
STARTPAGE=1230;ENDPAGE=1233;TITLE=Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002
Scopus-Elsevier
STARTPAGE=1230;ENDPAGE=1233;TITLE=Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002
Scopus-Elsevier
With a cascaded arc expanding thermal plasma intrinsic amorphous silicon can be deposited at growth rates varying from 0.2 to 10 nm/s. With increasing growth rate good material is obtained at higher deposition temperatures. At higher deposition tempe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f968e0f13b0f7a718d19a348b6be1a18
https://doi.org/10.1109/PVSC.2002.1190830
https://doi.org/10.1109/PVSC.2002.1190830
Autor:
DC Daan Schram, R.A.C.M.M. van Swaaij, BA Bas Korevaar, M.C.M. van de Sanden, A. H. M. Smets, C Chiel Smit
Publikováno v:
Conference Record of the 28th IEEE Photovoltaic Specialists Conference-2000, 916-919
STARTPAGE=916;ENDPAGE=919;TITLE=Conference Record of the 28th IEEE Photovoltaic Specialists Conference-2000
STARTPAGE=916;ENDPAGE=919;TITLE=Conference Record of the 28th IEEE Photovoltaic Specialists Conference-2000
With a cascaded arc expanding thermal plasma, intrinsic solar grade amorphous silicon can be deposited at growth rates varying from 2 to 100 /spl Aring//s. The temperature above which good material is obtained becomes higher for higher growth rates.
Publikováno v:
MRS Proceedings. 715
A cascaded arc expanding thermal plasma is used to deposit intrinsic hydrogenated amorphous silicon at growth rates between 0.2 and 3 nm/s. Incorporation into a single junction p-i-n solar cell resulted in an initial efficiency of 6.7%, whereas all t
Autor:
M.C.M. van de Sanden, A.M.H.N. Petit, C Chiel Smit, Wilhelmus Mathijs Marie Kessels, BA Bas Korevaar, R.A.C.M.M. van Swaaij
Publikováno v:
Conference Record of the 29th IEEE Photovoltaic Specialists Conference, New Orleans, May 19-24, 2002, 1170-1173
STARTPAGE=1170;ENDPAGE=1173;TITLE=Conference Record of the 29th IEEE Photovoltaic Specialists Conference, New Orleans, May 19-24, 2002
Scopus-Elsevier
STARTPAGE=1170;ENDPAGE=1173;TITLE=Conference Record of the 29th IEEE Photovoltaic Specialists Conference, New Orleans, May 19-24, 2002
Scopus-Elsevier
In order to produce thin silicon films for solar cells at high growth rates we deposited films with a cascaded arc expanding thermal plasma. We demonstrate the power of this technique by applying amorphous films deposited at rates up to 1.4 nm/s in s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::220ec45653bc044f2eb25186fc3823b4
https://research.tue.nl/nl/publications/6cab0eb5-849f-490d-8c97-b9cfdd673bf4
https://research.tue.nl/nl/publications/6cab0eb5-849f-490d-8c97-b9cfdd673bf4
Autor:
BA Bas Korevaar, C Chiel Smit, DC Daan Schram, van Racmm René Swaaij, van de Mcm Richard Sanden
Publikováno v:
Amorphous and heterogeneous silicon-based films-2001 : symposium held [at the 2001 MRS spring meeting,] April 16-20, 2001, San Francisco, California, U.S.A.
A cascaded arc expanding thermal plasma is used to deposit intrinsic hydrogenated amorphous silicon at growth rates larger than 2 Å/s. Implementation into a single junction p-i-n solar cell resulted in initial efficiencies of ∼7%, although all the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6cca0bd13e5622376815b21cc8ffd39b
https://research.tue.nl/nl/publications/6f04f7de-b4d9-4bcf-ab05-8d2aca8e31d0
https://research.tue.nl/nl/publications/6f04f7de-b4d9-4bcf-ab05-8d2aca8e31d0
Hydrogenated amorphous silicon deposited at very high growth rates by an expanding Ar-H2-SiH4 plasma
Autor:
G.J. Adriaenssens, RJ René Severens, Ahm Arno Smets, Wmm Erwin Kessels, van de Mcm Richard Sanden, DC Daan Schram, BA Bas Korevaar
Publikováno v:
Journal of Applied Physics, 89(4), 2404-2413. American Institute of Physics
The properties of hydrogenated amorphous silicon (a-Si:H) deposited at very high growth rates (6–80 nm/s) by means of a remote Ar–H2–SiH4 plasma have been investigated as a function of the H2 flow in the Ar–H2 operated plasma source. Both the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c299e404e72f91f20e7af9f5e0568a00
https://research.tue.nl/nl/publications/b3a6a6e6-066a-4a13-b09f-c823718eeadc
https://research.tue.nl/nl/publications/b3a6a6e6-066a-4a13-b09f-c823718eeadc
Autor:
DC Daan Schram, R.J. Severens, BA Bas Korevaar, Wilhelmus M. M. Kessels, Arno H. M. Smets, M.C.M. van de Sanden
Publikováno v:
MRS Proceedings. 557
This paper describes an extension of the silyl radical based kinetic growth model by atomic hydrogen induced surface hydrogen abstraction processes. It is shown that by including this direct abstraction process several problems of the SiH 3 based mod