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Millimeter-Wave Band CMOS RF Phased-Array Transceiver IC Designs for 5G Applications

Publikováno v: 2020 IEEE International Electron Devices Meeting (IEDM).

This paper presents design challenges and solutions for the fifth generation (5G) phased-array transceiver ICs in millimeter-wave (MMW) frequency bands. A 28nm bulk CMOS device technology is selected to integrate multiple RF phased-array elements in

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::d86ad2928f3bbabca4604eaa3f43d36b
https://doi.org/10.1109/iedm13553.2020.9371948

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Effects of Target of Rapamycin and Phosphatidylinositol 3-Kinase Inhibitors and Other Autophagy-Related Supplements on Life Span in y w Male Drosophila melanogaster.

Autor: Bearden, Aaron A.¹ (AUTHOR) aaron.bearden@health.southalabama.edu, Stewart, Emily M.¹ (AUTHOR), Casher, Candace C.¹ (AUTHOR), Shaddix, Meredith A.¹ (AUTHOR), Nobles, Amber C.¹ (AUTHOR), Mockett, Robin J.¹ (AUTHOR) mockett@southalabama.edu

Publikováno v: International Journal of Molecular Sciences. Nov2024, Vol. 25 Issue 21, p11504. 20p.

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Pterostilbene, a Dimethyl Derivative of Resveratrol, Exerts Cytotoxic Effects on Melanin-Producing Cells through Metabolic Activation by Tyrosinase.

Autor: Tanaka, Hitomi^1,2 (AUTHOR) hitanaka@u-gifu-ms.ac.jp, Nishimaki-Mogami, Tomoko³ (AUTHOR) mogami@nihs.go.jp, Tamehiro, Norimasa³ (AUTHOR) tamehiro@nihs.go.jp, Shibata, Norihito³ (AUTHOR) n-shibata@nihs.go.jp, Mandai, Hiroki⁴ (AUTHOR) hmandai@u-gifu-ms.ac.jp, Ito, Shosuke² (AUTHOR) sito@fujita-hu.ac.jp, Wakamatsu, Kazumasa² (AUTHOR) sito@fujita-hu.ac.jp

Publikováno v: International Journal of Molecular Sciences. Sep2024, Vol. 25 Issue 18, p9990. 20p.

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From Nature to Treatment: The Impact of Pterostilbene on Mitigating Retinal Ischemia–Reperfusion Damage by Reducing Oxidative Stress, Inflammation, and Apoptosis.

Autor: Pelles-Taskó, Beáta¹ (AUTHOR) pelles-tasko.beata@med.unideb.hu, Szekeres, Réka¹ (AUTHOR) szekeres.reka@med.unideb.hu, Takács, Barbara¹ (AUTHOR) takacs.barbara@pharm.unideb.hu, Szilágyi, Anna¹ (AUTHOR) dr.szilagyi.anna@med.unideb.hu, Ujvárosy, Dóra² (AUTHOR) ujvarosy.dora@med.unideb.hu, Bombicz, Mariann¹ (AUTHOR) bombicz.mariann@pharm.unideb.hu, Priksz, Dániel¹ (AUTHOR) priksz.daniel@pharm.unideb.hu, Varga, Balázs¹ (AUTHOR) varga.balazs@pharm.unideb.hu, Gesztelyi, Rudolf¹ (AUTHOR) gesztelyi.rudolf@pharm.unideb.hu, Szabó, Zoltán² (AUTHOR) szabo.zoltan@med.unideb.hu, Szilvássy, Zoltán¹ (AUTHOR) szilvassy.zoltan@med.unideb.hu, Juhász, Béla^1,2 (AUTHOR) juhasz.bela@med.unideb.hu

Publikováno v: Life (2075-1729). Sep2024, Vol. 14 Issue 9, p1148. 13p.

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Q-RPL: Q-Learning-Based Routing Protocol for Advanced Metering Infrastructure in Smart Grids.

Autor: Duenas Santos, Carlos Lester¹ (AUTHOR) ahmad.mezher@unb.ca, Mezher, Ahmad Mohamad¹ (AUTHOR) jcardena@unb.ca, Astudillo León, Juan Pablo^2,3 (AUTHOR) jastudillo@yachaytech.edu.ec, Cardenas Barrera, Julian¹ (AUTHOR) eduardo.castillo@unb.ca, Castillo Guerra, Eduardo¹ (AUTHOR) jmeng@unb.ca, Meng, Julian¹ (AUTHOR)

Publikováno v: Sensors (14248220). Aug2024, Vol. 24 Issue 15, p4818. 29p.

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Therapeutic Applications of Nanoformulated Resveratrol and Quercetin Phytochemicals in Colorectal Cancer—An Updated Review.

Autor: Unnikrishnan Meenakshi, Dhanalekshmi¹ (AUTHOR) dhanalekshmi@nu.edu.om, Narde, Gurpreet Kaur¹ (AUTHOR) kbalushi@nu.edu.om, Ahuja, Alka¹ (AUTHOR) dhanalekshmi@nu.edu.om, Al Balushi, Khalid¹ (AUTHOR), Francis, Arul Prakash² (AUTHOR) fdapharma@gmail.com, Khan, Shah Alam¹ (AUTHOR)

Publikováno v: Pharmaceutics. Jun2024, Vol. 16 Issue 6, p761. 21p.

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Effect of mechanical strength and residual stress of dielectric capping layer on electromigration performance in Cu/low-k interconnects

Publikováno v: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..

We present the effect of mechanical strength and residual stress of dielectric barrier on electromigration performance in Cu/low-k interconnects. It has been discovered that mechanical strength and residual stress of dielectric capping layer have a g

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::17e857fa1202c6ab089b66acb91a486b
https://doi.org/10.1109/iedm.2004.1419343

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Pseudo-breakdown events induced by biased-thermal-stressing of intra-level Cu interconnects-reliability and performance impact

Autor: H.-K. Kang, D.H. Lee, Jin-Yang Kim, Young-Jin Wee, S.Y. Kim, Chang-Sub Lee, T.K. Kim, W.S. Song, Seung-Man Choi, Sun-Young Kim, D.K. Jeong, B.S. Suh, Kang-Deog Suh, Kyu-Charn Park, Tae-hun Kim

Publikováno v: 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320).

The pseudo-breakdown (PBD) phenomenon has been investigated in intra-level reliability assessment of Cu-interconnects. Field and intralevel spacing dependence show that PBDs form an irreversible permanent damage path that differs from that of HBDs by

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::b502b65aff7ed44eff5ae499ba5ae117
https://doi.org/10.1109/relphy.2002.996653

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