Zobrazeno 1 - 10
of 30
pro vyhledávání: '"B.R. Epstein"'
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 12:102-113
The standard multivariate techniques of hypothesis testing and discrimination analysis have been applied to detect and classify faults in a variety of linear IC designs. These techniques are potentially useful for tracking IC failures during processi
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 38:8-14
Dielectric measurements using a probe consisting of a coaxial transmission line with an open-circuit end placed against the sample are discussed. For the 2.99- or 3.6-mm (OD) probes considered, a simple lumped parameter model shows errors above 1 GHz
Publikováno v:
[Proceedings] IGARSS '92 International Geoscience and Remote Sensing Symposium.
andsat Thematic Mapper (TM) multispectral imagery, while reducing image information loss. The method first removes interband correldtion of the image data by use of the Karhnnen-Loeve transform to prc luce the image principal components over the seve
Publikováno v:
IEEE MTT-S International Microwave Symposium Digest.
The authors report the experimental results on an X-band, passive, switch-type, single-ended mixer using a metal-insulator-semiconductor field-effect transistor (MISFET) fabricated from Ga/sub 0.47/In/sub 0.53/As. The device operated without any appl
Publikováno v:
1988., IEEE MTT-S International Microwave Symposium Digest.
A method is described that combines large-signal load tuning (i.e. load-pull) measurements with harmonic balance and optimization techniques to characterize GaAs MESFET devices. An important advantage of the method is that device model parameters are
Publikováno v:
Data Compression Conference
The authors report a methodology that enhances the compression of Landsat thematic mapper (TM) multispectral imagery, while reducing the image information loss. The method first removes interband correlation of the image data by use of the Karhunen-L
Publikováno v:
VTS
Classical discrimination analysis and neural network techniques are used to detect and classify possible faults in linear microcircuits. The success rates of simulated fault detection and classification are described for various types of analog and m
Autor:
M.H. Czigler, B.R. Epstein
Publikováno v:
Electro International, 1991.
Classical discrimination analysis and neural network techniques are used to detect and classify possible faults in linear microcircuits. The success rates of simulated fault detection and classification are described for various types of analog and m
Publikováno v:
Biophysical Journal. 52(3):421-425
An attempt was made to confirm previous reports of resonant-like dielectric absorption of plasmid DNA in aqueous solutions at 1–10 GHz. The dielectric properties of the sample were measured using an automatic network analyzer with two different tec
Publikováno v:
1987 IEEE MTT-S International Microwave Symposium Digest.
A convenient method has been developed during the past few years for study in the dielectric properties of materials. The method consists of placing the open end of a semirigid coaxial line against the sample and measuring the probe reflection coeffi