Zobrazeno 1 - 10
of 70
pro vyhledávání: '"B.M. Siegel"'
Publikováno v:
Ultramicroscopy. 6:367-376
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::10411892e68b33b33c3a53686b0fb41f
https://doi.org/10.1016/s0304-3991(81)80238-0
https://doi.org/10.1016/s0304-3991(81)80238-0
Publikováno v:
Ultramicroscopy. 9:65-74
A new method of nonlinear image processing is applied to high resolution experimental micrographs of chlorinated copper phthalocyanine taken on the Kyoto 500 kV electron microscope. With this new method of image processing the phase and amplitude of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::83301719e48fbd8309acc7ada0e05a6c
https://doi.org/10.1016/0304-3991(82)90229-7
https://doi.org/10.1016/0304-3991(82)90229-7
Autor:
B.M. Siegel, J.A. Kubby
Publikováno v:
Le Journal de Physique Colloques. 47:C2-107
Morphological changes that occur at an ion bombarded surface as a result of erosion by sputtering can be utilized for the machining of cylindrical ly symmetric submicron structures. Such structuring has produced tungsten field emitters of conical con
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::20fd32156fc9cee59bf097f6f58315e3
https://doi.org/10.1051/jphyscol:1986216
https://doi.org/10.1051/jphyscol:1986216
Autor:
J. D. Chinn, Robert A. Buhrman, E. D. Wolf, T.E. Everhart, G. W. Wicks, G.R. Hanson, C.E.C. Wood, J. Frey, J. P. Krusius, Lester F. Eastman, B.M. Siegel, I. Adesida, J Ballantyne, M.S. Isaacson, A.J. Muray, G.J. Sonek
Publikováno v:
Proceedings of the IEEE. 71:589-600
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b216c7af195af77fc9dd308d10388a28
https://doi.org/10.1109/proc.1983.12643
https://doi.org/10.1109/proc.1983.12643
Autor:
B.M. Siegel, Earl J. Kirkland
Publikováno v:
Ultramicroscopy. 6:169-180
The complete analytical image model for bright field transmission electron micrographs contains several nonlinear image components as well as several linear image components all of which are degraded by noise and an instrumental transfer function. Wh
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f10c1e4b6d99e14ce620287dce7b61df
https://doi.org/10.1016/s0304-3991(81)80195-7
https://doi.org/10.1016/s0304-3991(81)80195-7
Publikováno v:
Ultramicroscopy. 6:367-376
Computer image processing is applied to moderately low dose (11 e/A 2 ) STEM images of stained tobacco mosaic virus (TMV, intact helix). Periodic signal averaging and several simple methods of image enhancement are used. A method of separation of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::77454a6d31eced5bd5fca679a83abd61
https://doi.org/10.1016/s0304-3991(81)80223-9
https://doi.org/10.1016/s0304-3991(81)80223-9
Autor:
E.J. Kirkland, B.M. Siegel
Publikováno v:
Ultramicroscopy. 6:169-180
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2edfb56605c8527b41a417e0866178df
https://doi.org/10.1016/0304-3991(81)90057-7
https://doi.org/10.1016/0304-3991(81)90057-7
Publikováno v:
Journal of Physics E: Scientific Instruments. 20:61-66
The performance of a charged particle beam blanker in a high resolution lithography system is determined primarily by spurious deflection during beam switching. To achieve an optimum blanker design, therefore, it is necessary to calculate spurious de
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3a213866b124af492eb1b328aa5ecbfe
https://doi.org/10.1088/0022-3735/20/1/011
https://doi.org/10.1088/0022-3735/20/1/011
Autor:
B.M. Siegel
Publikováno v:
Micron (1969). 1:295-302
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d0d4443ebd678e85adb82ad93881353f
https://doi.org/10.1016/0047-7206(69)90036-3
https://doi.org/10.1016/0047-7206(69)90036-3
Publikováno v:
Ultramicroscopy. 5(4)
The theory of bright-field image formation of thin specimens in a conventional transmission electron microscope is presented. The recorded image contrast is shown to be predominantly linear in the electron atom scattering amplitudes which are in gene
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::429be7a37d47f0196e8e374cbb15d03b
https://pubmed.ncbi.nlm.nih.gov/7006175
https://pubmed.ncbi.nlm.nih.gov/7006175