Zobrazeno 1 - 10
of 99
pro vyhledávání: '"B.L. Yeoh"'
Publikováno v:
2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Publikováno v:
Microelectronics Reliability. 135:114569
Publikováno v:
Microelectronics Reliability. 92:136-142
It is well known that fail dies that exhibit obvious static power supply leakage current have a higher success of finding a defect, hence, a higher likelihood to be selected for failure analysis. When presented with choices, fail dies that exhibit si
Publikováno v:
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
It is a common perception that electrical fault isolation (EFI) is the heart of a successful integrated circuit failure analysis workflow. Much effort to enhance EFI approaches is vested on improving optical resolution and system signal-to-noise in o
Publikováno v:
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
In this work, we optimize tester-based optical beam induced resistance change to detect defects that cannot be assessed on chip power-up and require test vectors to initialize the chip. Enhancements using a series resistor along the source path as we
Publikováno v:
International Symposium for Testing and Failure Analysis.
Post-fault isolation layout net trace and circuit analysis based on abnormal hotspots is a critical step because it directly impacts the outcome of failure analysis. In this work, we review current commercial net tracing solutions in terms of their s
Publikováno v:
Microelectronics Reliability. 119:114069
In this work, we enhance tester-based laser induced techniques to detect defects that cannot be assessed by simple chip power-up and require test cycles to initialize the chip. A statistical resistance variation mapping method is proposed and describ
Publikováno v:
2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA).
In this paper, we report a new dynamic laser stimulation technique based on optical beam-induced current (OBIC) variation mapping for global fault localization. A production tester exercised the chip dynamically whilst a 1064 nm wavelength laser rast
Publikováno v:
International Symposium for Testing and Failure Analysis.
Bitmapping based on memory built-in self-test is the most efficient method to locate embedded memory defects in system-on-chips. Although this is the preferred approach to memory yield improvement, the procedure to enable bitmapping can be both time