Zobrazeno 1 - 10
of 29
pro vyhledávání: '"B.D. Shafer"'
Publikováno v:
Journal of Food Process Engineering. 32:855-880
Heat penetration studies were conducted to investigate the effect of potential heat transmission error on the heating factors as a result of internal mounting of remote sensors in 211 × 300 can sizes. The applicability of established correction fact
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4535ba931bc35d19e53c9f79f292c13c
https://doi.org/10.1111/j.1745-4530.2008.00250.x
https://doi.org/10.1111/j.1745-4530.2008.00250.x
Publikováno v:
Journal of Food Process Engineering. 27:246-266
Experiments were conducted using Bacillus stearothermophilus spores in 0.5% w/w carboxymethylcellulose suspension to evaluate come-up contributions from the tubular heat exchanger. A lab-scale UHT/HTST simulator that allowed samples to be collected a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0344184dd4b5afa0c883f4bf20e05b00
https://doi.org/10.1111/j.1745-4530.2004.00386.x
https://doi.org/10.1111/j.1745-4530.2004.00386.x
Publikováno v:
IEEE Transactions on Electron Devices. 35:1116-1119
Time constants for voltage transients following high energy ion strikes on static memories are determined from a series of experiments measuring cross sections for single-event upset. For a given strike location within the circuit, the transient time
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::40d65853cca0cd1ed3976c9bb6451913
https://doi.org/10.1109/16.3371
https://doi.org/10.1109/16.3371
Publikováno v:
Proceedings of the IEEE. 76:1470-1509
Several technologies, including bulk and epi CMOS, CMOS/SOI-SOS (silicon-on-insulator-silicon-on-sapphire), CML (current-mode logic), ECL (emitter-coupled logic), analog bipolar (JI, single-poly DI, and SOI) and GaAs E/D (enhancement/depletion) heter
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::227a3ee8a5465e86d4cc22615b2b8de5
https://doi.org/10.1109/5.90115
https://doi.org/10.1109/5.90115
Publikováno v:
Solar Cells. 6:3-15
The primary obstacle to the widespread use of photovoltaics for commercial electrical power production is the cost of solar cells. This obstacle can be attacked by looking for means of lowering solar cell prices or by increasing the power produced pe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::59473f19cde5ba9ddf93c453644c0859
https://doi.org/10.1016/0379-6787(82)90014-x
https://doi.org/10.1016/0379-6787(82)90014-x
Publikováno v:
[1987] NASECODE V: Proceedings of the Fifth International Conference on the Numerical Analysis of Semiconductor Devices and Integrated Circuits.
Single event upset (SEU) susceptibility due to high-energy ion hits on static RAM (SRAM) cells and various latch designs is evaluated using the two-dimensional circuit/transport SIFCOD code. Typical simulations involve as many as seven transistors, s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5818a711f91b70d8623dff7434416e42
https://doi.org/10.1109/nascod.1987.721132
https://doi.org/10.1109/nascod.1987.721132
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