Zobrazeno 1 - 10
of 25
pro vyhledávání: '"B. Verman"'
Autor:
T. S. Lopes, J. P. Teixeira, M. A. Curado, B. R. Ferreira, A. J. N. Oliveira, J. M. V. Cunha, M. Monteiro, A. Violas, J. R. S. Barbosa, P. C. Sousa, I. Çaha, J. Borme, K. Oliveira, J. Ring, W. C. Chen, Y. Zhou, K. Takei, E. Niemi, F. L. Deepak, M. Edoff, G. Brammertz, P. A. Fernandes, B. Vermang, P. M. P. Salomé
Publikováno v:
npj Flexible Electronics, Vol 7, Iss 1, Pp 1-11 (2023)
Abstract The incorporation of interface passivation structures in ultrathin Cu(In,Ga)Se2 based solar cells is shown. The fabrication used an industry scalable lithography technique—nanoimprint lithography (NIL)—for a 15 × 15 cm2 dielectric layer
Externí odkaz:
https://doaj.org/article/6643bc0d46994decb5d4877d421c8928
Publikováno v:
Journal of Applied Crystallography. 33:801-803
An approach to using multilayer optics for SAXS is discussed. The approach consists of employing a two-dimensional multilayer focusing optic to monochromatize and intensify the x-ray beam, and a pinhole system to further shape the beam. Depending on
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b378d03b04625fb74ce9183610b9d930
https://doi.org/10.1107/s0021889800099787
https://doi.org/10.1107/s0021889800099787
Autor:
R. Matsuo, L. Jiang, K. Sumii, T. Osakabe, B. Verman, Y. Hua, R. Samokyszyn, T. Ozawa, D. Wilcox, K. Omote, M. Aoyagi, B. Kim, M. Young
Publikováno v:
Powder Diffraction. 25:210-210
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0f8a348face15f673bb5ddccae49d05d
https://doi.org/10.1154/1.3454942
https://doi.org/10.1154/1.3454942
Publikováno v:
Powder Diffraction. 25:210-210
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3b67c33e1ef4bdaf91e62615078c4b08
https://doi.org/10.1154/1.3454936
https://doi.org/10.1154/1.3454936
Autor:
B. Simpson, B. Verman, K.F. Tesh, Cheng Yang, A.R. Criswell, A. Courville, J.D. Ferrara, Licai Jiang
Publikováno v:
Acta Crystallographica Section A Foundations of Crystallography. 64:C171-C171
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5dec506860b93b2b3df20d828bfa0b91
https://doi.org/10.1107/s0108767308094543
https://doi.org/10.1107/s0108767308094543
Autor:
Tatiana N. Drebushchak, Sb Ras, Sergey V. Goryainov, B. Verman, Nick Grupido, Vladimir Dmitriev, Vladimir V. Chernyshev, E.N. Kolesnik, H. Ahsbahs, Elena V. Boldyreva, Heidrun Sowa, Y. Platonov, Paul Pennartz
Publikováno v:
Acta Crystallographica Section A Foundations of Crystallography. 62:s255-s255
The response of crystal structures of L-serine and DL-serine to an increase in hydrostatic pressure was shown to be radically different: reversible phase transitions were observed in L-serine at 5.3 GPa (reverse transition at 4.0 GPa) and 7.8 GPa, wh
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::114bca6481bb770f60ffbb02b957dd45
https://doi.org/10.1107/s0108767306094918
https://doi.org/10.1107/s0108767306094918
Publikováno v:
Journal of Physics D: Applied Physics. 29:1675-1676
The necessity to take into consideration the angular size of the x-ray beam and its influence on the parameters of the reflected x-ray beam for ray tracing analysis will be shown.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::880e93d798048ef10baab56cf9713446
https://doi.org/10.1088/0022-3727/29/6/038
https://doi.org/10.1088/0022-3727/29/6/038
Publikováno v:
Powder Diffraction. 19:194-194
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3f1e2a6fd5764a2ae91c409d9eba2f60
https://doi.org/10.1154/1.1779870
https://doi.org/10.1154/1.1779870
Publikováno v:
Powder Diffraction. 18:178-178
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9ea72c3cacfd6ed92f2a5d267fe09211
https://doi.org/10.1154/1.1706989
https://doi.org/10.1154/1.1706989
Autor:
M. Kuribayashi, A. Courville, Cheng Yang, B. Verman, Licai Jiang, A.R. Criswell, K.F. Tesh, J.D. Ferrara
Publikováno v:
Acta Crystallographica Section A Foundations of Crystallography. 58:c74-c74
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a998793285c492010e5c7be42fa6c298
https://doi.org/10.1107/s0108767302087998
https://doi.org/10.1107/s0108767302087998