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Autor:
F. A. Chudnovskii, V.Ya. Velichko, S.L. Shokhor, V. Yu. Davydov, B. Sh. El'Kin, M. V. Belousov
Publikováno v:
Solid State Communications. 81:493-496
Polarized Raman spectra and resistivity-temperature curves for 60 keV N+ ion-implanted epitaxial thin films of YBa2Cu3O7, deposited on SrTiO3 (110) substrates, have been measured. Ion implantation leads to an intensity decrease and a widening of the