Zobrazeno 1 - 10
of 16
pro vyhledávání: '"B. Prasanna Lakshmi"'
Autor:
B. Prasanna Lakshmi
Publikováno v:
International Journal for Research in Applied Science and Engineering Technology. 6:2941-2952
Autor:
B. Prasanna Lakshmi
Publikováno v:
International Journal for Research in Applied Science and Engineering Technology. 6:2930-2940
To solve the energy consumption demand of the world and environmental problems in the future the distributed generation is considered an alternative approach. In this paper a new passive islanding detection technique was proposed for the Hybrid distr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::75f92786ecc4d7d5486185da90f3dbc5
https://zenodo.org/record/4422114
https://zenodo.org/record/4422114
Autor:
J. Rajesh Reddy, B Neelima Devi, B. Prasanna Lakshmi, R. Dhanasekaran, Rami Reddy Ch, A. Pandian
Publikováno v:
Indonesian Journal of Electrical Engineering and Computer Science. 17:1626
Grid integration of non conventional energy resources is increasing in day to day life to supply the global energy utilization requirement. The major problem with such integrated Distributed Generation (DG) is islanding. The islanding is originated i
Autor:
C. Usha Kiran, B. Prasanna Lakshmi
Publikováno v:
Journal of Nurse Midwifery and Maternal Health. 2:163-168
Publikováno v:
Superlattices and Microstructures. 60:358-369
We report on the capacitance–frequency (C–f) and conductance–frequency (G–f) characteristics of Ir/n-InGaN Schottky diode with various biases and at different temperature. Investigations reveal that the capacitance is almost independent of te
Publikováno v:
Applied Physics A. 113:713-722
We report on the effect of an annealing temperature on the electrical properties of Au/Ta2O5/n-GaN metal–insulator–semiconductor (MIS) structure by current–voltage (I–V) and capacitance–voltage (C–V) measurements. The measured Schottky ba
Publikováno v:
Superlattices and Microstructures. 56:64-76
The effect of annealing temperature on interface properties of iridium/ruthenium (Ir/Ru) Schottky contacts on n-type InGaN have been investigated by current–voltage (I–V), capacitance–voltage (C–V), Auger electron spectroscopy (AES) and X-ray
Publikováno v:
Current Applied Physics. 12:765-772
The temperature-dependent electrical properties of Au/SiO 2 /n-GaN metal-insulator-semiconductor (MIS) structure have been investigated in the temperature range of 120–390 K. Anomalous strong temperature dependencies of the barrier height ( Φ bo )
Publikováno v:
Journal of Alloys and Compounds. 509:8001-8007
In the present work, we have investigated the current–voltage ( I – V ) and capacitance–voltage ( C – V ) characteristics of Au/SiO 2 /n-GaN metal–insulator–semiconductor (MIS) Schottky diode and compared with Au/n-GaN metal–semiconduct