Zobrazeno 1 - 10
of 63
pro vyhledávání: '"B. M. Purcell"'
Autor:
R. B. Irwin, F. Hillion, B.B. Rossie, T. L. Shofner, R. H. Mills, Fred A. Stevie, M. J. Antonell, S. R. Brown, B. M. Purcell, Catherine Vartuli, Lucille A. Giannuzzi
Publikováno v:
Surface and Interface Analysis. 31:345-351
Commercially available focused ion beam (FIB) workstations with spatial resolution of 5–7 nm can prepare specimens with excellent lateral resolution. This capability has been utilized extensively by the semiconductor industry to obtain materials ch
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2221d3113f96e783648862828134044e
https://doi.org/10.1002/sia.1063
https://doi.org/10.1002/sia.1063
Autor:
S. D. Anderson, B. M. Purcell, T. L. Shofner, S. R. Brown, Fred A. Stevie, B. B. Rossie, R. B. Irwin, A. Scwhitter, J. M. McKinley, Catherine Vartuli
Publikováno v:
Microscopy and Microanalysis. 7:200-201
Energy Dispersive Spectrometry (EDS) is an ubiquitous method of elemental analysis for SEM, TEM, and STEM applications. The elements of interest are generally quantified without standards using theoretical calculations or by using standards that are
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8f4c4b55d6a06cc5da19df41aa18afca
https://doi.org/10.1017/s1431927600027070
https://doi.org/10.1017/s1431927600027070
Autor:
R. B. Irwin, R. J. Wesson, J. M. McKinley, Fred A. Stevie, B. M. Purcell, Catherine Vartuli, Lucille A. Giannuzzi, T. L. Shofner
Publikováno v:
Microscopy and Microanalysis. 6:536-537
Energy Dispersive Spectrometry (EDS) is generally calibrated for quantification using elemental standards. This can introduce errors when quantifying non-elemental samples and does not provide an accurate detection limit. In addition, variations betw
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::224dc301909e910973a58e18c7953b05
https://doi.org/10.1017/s1431927600035170
https://doi.org/10.1017/s1431927600035170
Autor:
David A. Wollman, Catherine Vartuli, M. J. Antonell, B. M. Purcell, S. A. Anderson, J. M. McKinley, Bobby To, Fred A. Stevie, T. L. Shofner, R. B. Irwin
Publikováno v:
Microscopy and Microanalysis. 6:128-129
Cu contamination has become a larger concern as more semiconductor fabrication facilities switch from aluminum to Cu interconnects. The resolution limits of several analytical tools are compared to determine the optimum analysis methods for detecting
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6ae47bcf93e677776e6ba34a2c2b22ff
https://doi.org/10.1017/s1431927600033134
https://doi.org/10.1017/s1431927600033134
Publikováno v:
Microscopy and Microanalysis. 5:896-897
Scanning Electron Microscopy/Energy Dispersive Spectroscopy (SEM/EDS) has become less useful for semiconductor samples as feature dimensions decrease. It has become increasingly difficult to get sufficient signal from small features because of the la
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d2df5672a89f1357cc1ce721f812a593
https://doi.org/10.1017/s1431927600017803
https://doi.org/10.1017/s1431927600017803
Autor:
Valladales‐Restrepo, Luis Fernando1,2,3 (AUTHOR), Vargas‐Díaz, Katherine3 (AUTHOR), Peña‐Verjan, Nathalia Marcela3 (AUTHOR), Londoño‐Cano, Diego Andrés3 (AUTHOR), Álvarez‐Ayala, Daniela3 (AUTHOR), Orrego‐Giraldo, María José3 (AUTHOR), Machado‐Alba, Jorge Enrique1 (AUTHOR) machado@utp.edu.co
Publikováno v:
Zoonoses & Public Health. Dec2022, Vol. 69 Issue 8, p978-986. 9p.
Autor:
Shanahan, Russell, Stil, Jeroen M., Anderson, Loren, Beuther, Henrik, Goldsmith, Paul, Klessen, Ralf S., Rugel, Michael, Soler, Juan D.
Publikováno v:
Astrophysical Journal; 11/10/2023, Vol. 957 Issue 2, p1-10, 10p
Autor:
Brito Lopes, Fernando1,2 (AUTHOR) camult@gmail.com, Magnabosco, Cláudio U.1 (AUTHOR), Passafaro, Tiago L.3 (AUTHOR), Brunes, Ludmilla C.4 (AUTHOR), Costa, Marcos F. O.5 (AUTHOR), Eifert, Eduardo C.1 (AUTHOR), Narciso, Marcelo G.5 (AUTHOR), Rosa, Guilherme J. M.3,6 (AUTHOR), Lobo, Raysildo B.7 (AUTHOR), Baldi, Fernando1 (AUTHOR)
Publikováno v:
Journal of Animal Breeding & Genetics. Sep2020, Vol. 137 Issue 5, p438-448. 11p.
Autor:
Srinivasan, Shylaja, Chen, Ling, Udler, Miriam, Todd, Jennifer, Kelsey, Megan M., Haymond, Morey W., Arslanian, Silva, Zeitler, Philip, Gubitosi-Klug, Rose, Nadeau, Kristen J., Kutney, Katherine, White, Neil H., Li, Josephine H., Perry, James A., Kaur, Varinderpal, Brenner, Laura, Mercader, Josep M., Dawed, Adem, Pearson, Ewan R., Yee, Sook-Wah
Publikováno v:
Pediatric Diabetes; 5/24/2023, p1-6, 6p
Autor:
Wang, Xiaowen1 (AUTHOR), Wu, Junhui1 (AUTHOR), Wu, Yao1 (AUTHOR), Wang, Mengying1 (AUTHOR), Wang, Zijing1 (AUTHOR), Wu, Tao1 (AUTHOR), Chen, Dafang1 (AUTHOR), Tang, Xun1 (AUTHOR), Qin, Xueying1 (AUTHOR), Wu, Yiqun1 (AUTHOR), Hu, Yonghua1,2 (AUTHOR)
Publikováno v:
Journal of Diabetes Research. 1/13/2020, p1-8. 8p.