Zobrazeno 1 - 10
of 14
pro vyhledávání: '"B. M. Nichols"'
Publikováno v:
Optics Communications. 219:377-382
The electro-optic properties of epitaxial KTaxNb1−xO3 thin films were measured throughout the entire solid solution range, 0⩽x⩽1. For unpoled films, electro-optic coefficients measured at 100 kHz exhibited an average value of 4.7 pm/V at x=0 an
Publikováno v:
Journal of Materials Research. 18:106-110
The phase stability of epitaxial KTaxNb1−xO3 (0 ≤ x ≤ 1) thin films, with compositions over the entire solid solution range, was investigated. KTaxNb1−xO3 thin films were deposited on (100) MgAl2O4 substrates by metalorganic chemical vapor de
Publikováno v:
Journal of Materials Research. 17:275-278
The dielectric response of KNbO3 epitaxial ferroelectric thin films was measured as a function of bias, frequency, and temperature. Thin films with a thickness of 80 to 350 nm were deposited on spinel substrates by low-pressure metalorganic chemical
Autor:
Dennis W. Hancock, Joao M. B. Vendramini, Brandi B. Karisch, M. S. Gadberry, B. M. Nichols, M. K. Mullenix, D. L. Fernandez, C. M. Holland
Publikováno v:
Journal of Animal Science. 94:10-10
Publikováno v:
Applied Physics Letters. 75:2707-2709
The dynamic response of the electro-optic coefficient of epitaxial KNbO3 thin films was measured at room temperature. The effective electro-optic coefficient for these films at 100 kHz is 12 pm/V. The magnitude of the electro-optic response increased
An analysis of the dynamic dielectric and electro-optic relaxation response of thin film ferroelectrics is presented. The analysis is based upon the relaxation of ferroelectric domains with a continuous distribution of sizes given by percolation theo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d33f052a03dce042af68fae437a214f6
http://arxiv.org/abs/cond-mat/0205007
http://arxiv.org/abs/cond-mat/0205007
Publikováno v:
MRS Proceedings. 541
The nonlinear optical properties of epitaxial KNbO3 were studied for films grown by metalorganic chemical vapor deposition on different substrates. X-ray diffraction revealed epitaxial KNbO3 with a (110) orientation for layers deposited on single cry
Autor:
B. M. Nichols, M. H. Ervin
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 27:2982
Electron beam induced deposition (EBID) has been investigated by many researchers for a number of applications requiring maskless deposition of material. Here, a scanning electron microscope is used to perform EBID of cobalt (Co) nanoparticles, which
Publikováno v:
Military medicine. 137(7)
Publikováno v:
Clinical chemistry. 16(11)