Zobrazeno 1 - 10
of 26
pro vyhledávání: '"B. L. Gregory"'
Autor:
B. L. Gregory, Kate Plaisted-Grant
Publikováno v:
Journal of Autism and Developmental Disorders. 46:1503-1512
A high Autism-Spectrum Quotient (AQ) score (Baron-Cohen et al. in J Autism Dev Disord 31(1):5-17, 2001) is increasingly used as a proxy in empirical studies of perceptual mechanisms in autism. Several investigations have assessed perception in non-au
Publikováno v:
Polymer. 32:1605-1611
Results of experimental studies on fatigue fracture behaviour of PEEK are reported. Experiments are conducted on injection moulded single edge notched specimens of 2.68 mm in thickness. At low crack speeds the crack tip is relatively round. At relati
Experimental investigation of the effects of stress rate and stress level on fracture in polystyrene
Autor:
John Botsis, B. L. Gregory
Publikováno v:
Journal of Materials Science. 26:1015-1026
The effects of stress rate and stress level on fatigue crack propagation in compression-moulded single-edge notched specimens (0.25 mm in thickness) of polystyrene are reported. Values of the stress rate $$\dot \sigma$$ are obtained from the formula
Autor:
Brian A. Summers, B. L. Gregory, D. Lipsitz, J. C. Fyee, R. Pettigrew, A. deLahunta, G. D. Shelton
Publikováno v:
Veterinary pathology. 44(1)
Arrested physical development and neurologic abnormalities were identified in 3 of 5 Rat Terrier puppies at 9 weeks of age. Bilaterally firm symmetrical masses were palpated in the region of the thyroid glands. Low serum total (T4) and free thyroxine
Publikováno v:
The Journal of prosthetic dentistry. 83(6)
The cause of dental erosion may be difficult to establish because of its many presentations. Determination of the cause is an important aspect of diagnosis before extensive prosthodontic rehabilitation.This cross-sectional study evaluated the associa
Autor:
G. F. Derbenwick, B. L. Gregory
Publikováno v:
IEEE Transactions on Nuclear Science. 22:2151-2156
The effects of processing steps on the radiation hardness of MOS devices have been systematically investigated. Quantitative relationships between the radiation-induced voltage shifts and processing parameters have been determined, where possible. Us
Autor:
B. L. Gregory
Publikováno v:
IEEE Transactions on Nuclear Science. 22:2295-2302
Optimized dry oxide processes have recently yielded notable improvements in CMOS radiation hardness. For these processes to be manufacturable, controls and screens are required to allow both manufacturer and user to guarantee survival of specific rad
Autor:
B. L. Gregory, H. H. Sander
Publikováno v:
IEEE Transactions on Nuclear Science. 22:2157-2162
Irradiation studies at 76°K are described which demonstrate that radiation-produced holes in SiO2 are immobile at this temperature. If an electric field of either polarity is present in the SiO2 during 76°K irradiation, to sweep out the mobile elec
Autor:
John Botsis, B. L. Gregory
Publikováno v:
Polymer Engineering and Science. 29:1592-1597
Results of studies on fatigue fracture in polystyrene are reported. Experiments were carried out on tension-tension single edge notched specimens, 0.25 mm thick. Macroscopic studies involved the propagation of the crack and its associated active zone
Publikováno v:
IEEE Transactions on Nuclear Science. 22:2208-2213
Ionizing-radiation-induced threshold voltage shifts in CMOS integrated circuits will drastically degrade circuit performance unless the design parameters related to the fabrication process are properly chosen. To formulate an approach to CMOS design