Defect Oriented Testing for Analog/Mixed-Signal Designs

Autor: M. van Beurden, Hamidreza Hashempour, J.J. Dohmen, Bratislav Tasić, B. Kruseman, C. Hora, Yizi Xing

Publikováno v: IEEE Design & Test of Computers. 29:72-80

In this contribution, the authors describe an application of Defect Oriented Testing (DOT) to commercial mixed-signal designs. A major challenge of DOT application to these designs is the enormous simulation time typically required. The authors addre

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::e4e7fac94199ba86492a8b5e0377270f
https://doi.org/10.1109/mdt.2012.2210852

Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out

Autor: Joan Figueras, Rosa Rodriguez-Montanes, C. Hora, D. Arumi, B. Kruseman, S. Eichenberger

Publikováno v: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 30:1911-1922

The development of accurate diagnosis methodologies is important to identify process problems and achieve fast yield improvement. As open defects are becoming dominant in some CMOS technologies, their accurate diagnosis is key to improving the qualit

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::7df78e4d2d5910548db2f93959af8a0d
https://doi.org/10.1109/tcad.2011.2165071

Modeling Power Supply Noise in Delay Testing

Autor: P.J.A. van de Wiel, G. Gronthoud, Jing Wang, B. Kruseman, Ananta K. Majhi, S. Eichenberger, Duncan M. Walker, L.E. Villagra, Xiang Lu

Publikováno v: IEEE Design & Test of Computers. 24:226-234

Excessive power supply noise during test can cause overkill. This article discusses two models for supply noise in delay testing and their application to test compaction. The proposed noise models avoid complicated power network analysis, making them

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::73cf7c503110248d5cea85d39d92f2a9
https://doi.org/10.1109/mdt.2007.76

Alpha-particle-induced SER of embedded SRAMs affected by variations in process parameters and by the use of process options

Autor: Tino Heijmen, B. Kruseman

Publikováno v: Solid-State Electronics. 49:1783-1790

We investigate the alpha-particle-induced soft-error rate (SER) of embedded SRAMs with a focus on the spread in SER owing to variations in the process parameters. The alpha-particle-induced SER of SRAM-instances processed in 0.18 and 0.13 μm technol

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::2a18f4cf09def0da32cb8756f9648763
https://doi.org/10.1016/j.sse.2005.10.025

Diagnosis of Local Spot Defects in Analog Circuits

Autor: Salvador Mir, Ke Huang, B. Kruseman, Haralampos-G. Stratigopoulos, Yizi Xing, C. Hora

Publikováno v: IEEE Transactions on Instrumentation and Measurement
IEEE Transactions on Instrumentation and Measurement, Institute of Electrical and Electronics Engineers, 2012, 61 (10), pp.2701-2712. ⟨10.1109/TIM.2012.2196390⟩

International audience; We present a method for diagnosing local spot defects in analog circuits. The method aims to identify a subset of defects that are likely to have occurred and suggests to give them priority in a classical failure analysis. For

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bc13976b9924c0c172d81898ba8c000d
https://hal.archives-ouvertes.fr/hal-00743568