Zobrazeno 1 - 10
of 12
pro vyhledávání: '"B. K. S. V. L. Varaprasad"'
Publikováno v:
Journal of Electronic Materials. 51:2747-2765
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 21:70-78
In a spacecraft, flip-flops take part in holding operational configuration for long durations. Single event transients (SETs) at control inputs of such flip-flops can culminate in single event upsets (SEUs). An SEU may cause loss of one or more missi
Publikováno v:
Life Cycle Reliability and Safety Engineering. 10:139-149
Radiation hardened by design (RHBD) latches incorporate internal node-level redundancy to mitigate single event upset (SEU). However, SEU fault simulation study has revealed that many such SEU tolerant RHBD latches can still possess an SEU at critica
Autor:
Avinash Kothuru, Sanket Goel, Amrendra Pratap Singh, C Hanumanth Rao, B. K. S. V. L. Varaprasad
Publikováno v:
IEEE Transactions on Components, Packaging and Manufacturing Technology. 10:1921-1928
Radio frequency (RF) or microwave printed circuit board (PCB) is a type of PCB designed to operate on signals in megahertz-to-gigahertz frequency (medium to extremely high frequency) ranges. The materials used to construct these PCBs are advanced com
Publikováno v:
Intelligent Sustainable Systems ISBN: 9789811663086
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b962500e1fa2a99255236bf78dab7584
https://doi.org/10.1007/978-981-16-6309-3_50
https://doi.org/10.1007/978-981-16-6309-3_50
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 19:680-687
Many radiation hardened by design (RHBD) latch architectures have been presented in the literature. These architectures are designed such that these can tolerate a charged particle impact at multiple nodes of the latch. These architectures differ in
Publikováno v:
2021 Fourth International Conference on Electrical, Computer and Communication Technologies (ICECCT).
Autor:
K. Padmapriya, Sajjade Faisal Mustafa, Rahul Anilkumar, Shivani Prasad Bondapalli, Debjyoti Mallik, B. K. S. V. L. Varaprasad
Publikováno v:
2021 Fourth International Conference on Electrical, Computer and Communication Technologies (ICECCT).
Publikováno v:
2020 International Conference on Inventive Computation Technologies (ICICT).
With advances in semiconductor technology, device integration density increases resulting in more complex designs with more testing challenges. Limited speed, memory and I/O channels of Automatic Test Equipment (ATE) is a testing challenge. Test powe
Publikováno v:
2020 International Conference on Inventive Computation Technologies (ICICT).
Many simple to complex radiation hardened by design (RHBD) latch architectures are presented in the literature that has been intended to use in logic and memory circuits of a spaceborne system. These RHBD latch architectures primarily differ from eac