Zobrazeno 1 - 10
of 16
pro vyhledávání: '"B. J. Villis"'
Autor:
K. L. Litvinenko, E. T. Bowyer, P. T. Greenland, N. Stavrias, Juerong Li, R. Gwilliam, B. J. Villis, G. Matmon, M. L. Y. Pang, B. Redlich, A. F. G. van der Meer, C. R. Pidgeon, G. Aeppli, B. N. Murdin
Publikováno v:
Nature Communications, Vol 8, Iss 1, Pp 1-1 (2017)
Nature Communications 6: Article number: 6549 (2015); Published: 20 March 2015; Updated: 20 April 2017 This Article was originally published under a CC BY-NC-ND 4.0 license, but has now been made available under a CC BY 4.0 license. The PDF and HTML
Externí odkaz:
https://doaj.org/article/71c18582228e41d4b5255e70711c219e
Autor:
B. J. Villis, James E. Stott, Gabriel Aeppli, Sandrine Heutz, Luke Fleet, Arokia Nathan, Michele Serri, Salahud Din
Publikováno v:
ACS applied materialsinterfaces. 9(24)
While organic semiconductors provide tantalizing possibilities for low-cost, light-weight, flexible electronic devices, their current use in transistors-the fundamental building block-is rather limited as their speed and reliability are not competiti
Autor:
B. Redlich, B. J. Villis, N. Stavrias, Russell M. Gwilliam, Juerong Li, Konstantin Litvinenko, M. Pang, B. N. Murdin, Guy Matmon, Gabriel Aeppli, C. R. Pidgeon, A.F.G. van der Meer, E. T. Bowyer, P. T. Greenland
Publikováno v:
Nature Communications, Vol 8, Iss 1, Pp 1-1 (2017)
The ability to control dynamics of quantum states by optical interference, and subsequent electrical read-out, is crucial for solid state quantum technologies. Ramsey interference has been successfully observed for spins in silicon and nitrogen vacan
Autor:
N. Stavrias, Chennupati Jagadish, Jennifer Wong-Leung, Brett C. Johnson, J. E. Burgess, Jeffrey C. McCallum, B. J. Villis, James Williams, Supakit Charnvanichborikarn
Publikováno v:
physica status solidi (a). 208:620-623
The presence of boron in silicon has been shown to have a deleterious effect on the luminescence of interstitial-related centres, particularly the W-centre which is often observed after ion implantation and a low temperature anneal. Competition betwe
Autor:
B. J. Villis, Jeffrey C. McCallum
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 257:212-216
In this paper, we present preliminary results of a deep level transient spectroscopy study of the charge traps produced as a function of implantation angle for 70 keV H ions implanted into n-type Si(1 0 0) crystals. The defect types, concentrations a
Autor:
Konstantin Litvinenko, Britta Redlich, Gabriel Aeppli, Juerong Li, B. N. Murdin, C. R. Pidgeon, A. F. G. van der Meer, B. J. Villis, M. Pang, Guy Matmon, N. Stavrias, P. T. Greenland, E. T. Bowyer, Russell M. Gwilliam
Publikováno v:
Nature Communications, 6
Nature Communications
Nature Communications
The ability to control dynamics of quantum states by optical interference, and subsequent electrical read-out, is crucial for solid state quantum technologies. Ramsey interference has been successfully observed for spins in silicon and nitrogen vacan
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::46ab2e0892e3834caa5ea222c5c06158
http://hdl.handle.net/2066/144916
http://hdl.handle.net/2066/144916
Autor:
Guy Matmon, C. R. Pidgeon, Gabriel Aeppli, A. F. G. van der Meer, B. J. Villis, Britta Redlich, Juerong Li, B. N. Murdin, E. T. Bowyer, P. T. Greenland
Publikováno v:
Physical Review. B, Condensed Matter and Materials Physics, 92, 165310
Physical Review. B, Condensed Matter and Materials Physics, 92, 16, pp. 165310
Physical Review. B, Condensed Matter and Materials Physics, 92, 16, pp. 165310
This work describes detection of the laser preparation and subsequent coherent manipulation of the quantum states of orbital levels of donors in doped Si, by measuring the voltage drop across an irradiated Si sample. This electrical signal, which ari
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0d0fc20f1f34eb3281a3091db90295b5
https://doi.org/10.1103/PhysRevB.92.165310
https://doi.org/10.1103/PhysRevB.92.165310
Autor:
Xavier Jehl, Sylvain Barraud, B. J. Villis, Alexei O. Orlov, Gregory L. Snider, Patrick Fay, Marc Sanquer, Maud Vinet
Publikováno v:
Applied Physics Letters
Applied Physics Letters, 2014, 104 (23), pp.233503
Applied Physics Letters, American Institute of Physics, 2014, 104 (23), pp.233503
Applied Physics Letters, 2014, 104 (23), pp.233503
Applied Physics Letters, American Institute of Physics, 2014, 104 (23), pp.233503
The continuous downscaling of transistors results in nanoscale devices which require fewer and fewer charged carriers for their operation. The ultimate charge controlled device, the single-electron transistor (SET), controls the transfer of individua
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f6cd7c7713829d06c053526efc1c399b
https://hal.univ-grenoble-alpes.fr/hal-02009699
https://hal.univ-grenoble-alpes.fr/hal-02009699
Radio-frequency reflectometry in silicon single-electron transistors (SETs) is presented. At low temperatures (
3 pages, 3 figures
3 pages, 3 figures
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3663baa39d48a27b385bc15359d83843
http://arxiv.org/abs/1109.4545
http://arxiv.org/abs/1109.4545
Autor:
James Williams, Brett C. Johnson, J. E. Burgess, Jeffrey C. McCallum, Jennifer Wong-Leung, Supakit Charnvanichborikarn, B. J. Villis
Publikováno v:
2010 Conference on Optoelectronic and Microelectronic Materials and Devices.
The photoluminescence of self-interstitials in silicon produced by ion implantation is investigated. A range of annealing temperatures have been used to follow the evolution of these defects. The effect on the formation of these defects in the presen