Zobrazeno 1 - 5
of 5
pro vyhledávání: '"B. I. Khizhnyak"'
Publikováno v:
Solid State Communications. 81:781-784
The measurements of the acceptor concentration dependence of the 85 K 1 ƒ noise in n-type Hg1−xCdxTe monocrystals have been extended, by examining the effect of native, annealing induced Hg vacancies, over the conductivity type conversion point. E
Publikováno v:
Journal of Applied Physics. 70:1561-1564
1/f noise measurements have been performed on Al‐Cu thin films, of varying grain size, which were also subjected to electromigration lifetime tests. The results indicate a strong grain size dependence of the 1/f noise magnitude in the films. Moreov
Autor:
B. I. Khizhnyak, A. V. Lyubchenko, E. A. Salkov, L. A. Karachevtseva, V. A. Petryakov, I. S. Bakshee
Publikováno v:
physica status solidi (a). 117:K37-K41
En allant des dislocations individuelles aux amas de dislocations, puis jusqu'aux joints de grains a petit angle, le bruit en exces dans chaque region varie. Ce bruit passe d'un niveau relativement bas a un bruit augmente en 1/f a travers un bruit fo
Autor:
L. A. Karachevtseva, E. A. Sal'kov, B. I. Khizhnyak, I. S. Bakshee, V. A. Petryakov, A. V. Lyubchenko
Publikováno v:
January 16
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::073809be6da6303c70e69ffbc30a39fa
https://doi.org/10.1515/9783112480809-046
https://doi.org/10.1515/9783112480809-046
Publikováno v:
Solid-State Electronics. 33:1653-1654