List of contributors

Autor: D. Balzar, D.M. Bortz, B. Cao, D. Casimir, J. Chen, C.V. Ciobanu, H. Cronk, M.M. De Souza, J. DeJoannis, J. Eymery, G. Fitzgerald, R. Garcia-Sanchez, B. Gittleman, M.K. Harbola, L. Hu, M. Hu, P. Joseph, N. Kang, D. Le Si Dang, G. Li, J. Li, J. Luo, E. Mansfield, M. Meunier, P. Misra, A. Mookerjee, P. Pillai, L. Rast, S. Shan, P. Singh, Z. Skeete, A. Smolyanitsky, M. Stowell, V.K. Tewary, K. Wang, Q. Wang, H. Wu, J. Wu, S. Yan, N. Yue, Y. Zhang, W. Zhao, Y. Zhao, C.-J. Zhong, W. Zhou, S. Zhuiykov

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::9d4d667926ce2f1c6a994ec19b96a50a
https://doi.org/10.1016/b978-1-78242-228-0.09991-9

Impact of narrow trench geometries on copper film crystallography

Autor: G. Brunoldi, K. J. Kozaczek, T. Marangon, B. Gittleman

Publikováno v: Microelectronic Engineering. 83:2208-2212

Crystallographic texture of copper in interconnect trenches after anneal and planarization has been mapped across 200mm wafers by means of X-ray diffraction (XRD). Texture in trenches 70nm and 100nm wide with aspect ratios of 2-2.5 was found to have

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::ac53c513e8757d3a17613068a3637ac1
https://doi.org/10.1016/j.mee.2006.10.005

Analyzing the Labor Market Outcomes of Occupational Licensing

Autor: Maury B. Gittleman, Mark A. Klee, Morris Kleiner

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::8235d033c90570d916c70c04135be3e9
https://doi.org/10.21034/sr.504

RETRIEVING CEMENTED TELESCOPIC PROSTHESES

Autor: Neal B. Gittleman

Publikováno v: Implant Dentistry. 5:91-95

Advantages of telescopic prostheses are in maintenance, repair, alteration, conversion, and offsetting problems of parallelism. A cemented telescopic implant prosthesis can be retrieved by incorporating a window or recess in the copings during the wa

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::041970b7e9c103d7b642b7e927a71086
https://doi.org/10.1097/00008505-199600520-00003

Measurement of theD*(2010) branching fractions

Autor: F. Butler, X. Fu, G. Kalbfleisch, M. Lambrecht, W. R. Ross, P. Skubic, J. Snow, P.-L. Wang, D. Bortoletto, D. N. Brown, J. Dominick, R. L. McIlwain, T. Miao, D. H. Miller, M. Modesitt, S. F. Schaffner, E. I. Shibata, I. P. J. Shipsey, M. Battle, J. Ernst, H. Kroha, S. Roberts, K. Sparks, E. H. Thorndike, C.-H. Wang, S. Sanghera, T. Skwarnicki, R. Stroynowski, M. Artuso, M. Goldberg, N. Horwitz, R. Kennett, G. C. Moneti, F. Muheim, S. Playfer, Y. Rozen, P. Rubin, S. Stone, M. Thulasidas, W.-M. Yao, G. Zhu, A. V. Barnes, J. Bartelt, S. E. Csorna, Z. Egyed, V. Jain, P. Sheldon, D. S. Akerib, B. Barish, M. Chadha, D. F. Cowen, G. Eigen, J. S. Miller, J. Urheim, A. J. Weinstein, A. Bean, J. Gronberg, R. Kutschke, S. Menary, R. J. Morrison, H. N. Nelson, J. D. Richman, H. Tajima, D. Schmidt, D. Sperka, M. S. Witherell, D. Acosta, G. Masek, B. Ong, H. Paar, M. Sivertz, M. Procario, M. Daoudi, W. T. Ford, D. R. Johnson, K. Lingel, M. Lohner, P. Rankin, J. G. Smith, J. P. Alexander, C. Bebek, K. Berkelman, D. Besson, T. E. Browder, D. G. Cassel, D. M. Coffman, P. S. Drell, R. Ehrlich, R. S. Galik, M. Garcia-Sciveres, B. Geiser, B. Gittleman, S. W. Gray, D. L. Hartill, B. K. Heltsley, K. Honscheid, C. Jones, J. Kandaswamy, N. Katayama, P. C. Kim, D. L. Kreinick, G. S. Ludwig, J. Masui, J. Mevissen, N. B. Mistry, C. R. Ng, E. Nordberg, C. O’Grady, J. R. Patterson, D. Peterson, D. Riley, M. Sapper, M. Selen, H. Worden, M. Worris, F. Würthwein, P. Avery, A. Freyberger, J. Rodriguez, R. Stephens, J. Yelton, D. Cinabro, S. Henderson, K. Kinoshita, T. Liu, M. Saulnier, R. Wilson, H. Yamamoto, A. J. Sadoff, R. Ammar, S. Ball, P. Baringer, D. Coppage, N. Copty, R. Davis, N. Hancock, M. Kelly, N. Kwak, H. Lam, Y. Kubota, M. Lattery, J. K. Nelson, S. Patton, D. Perticone, R. Poling, V. Savinov, S. Schrenk, R. Wang, M. S. Alam, I. J. Kim, J. J. O’Neill, B. Nemati, V. Romero, H. Severini, C. R. Sun, P.-N. Wang, M. M. Zoeller, G. Crawford, R. Fulton, K. K. Gan, H. Kagan, R. Kass, J. Lee, R. Malchow, F. Morrow, M. Sung, C. White, J. Whitmore, P. Wilson

Publikováno v: Physical Review Letters. 69:2041-2045

We report a measurement of the {ital D}{sup *+} and {ital D}{sup *0} decay branching fractions based on 780 pb{sup {minus}1} of data collected with the CLEO II detector. For radiative {ital D}{sup *+} decay, we obtain an upper limit, {ital scrB}({ita

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::3c1ba7fcc9a5848e2de9d95210d7af1d
https://doi.org/10.1103/physrevlett.69.2041