Zobrazeno 1 - 10
of 16
pro vyhledávání: '"B. E. Artz"'
Autor:
L. C. Davis, B. E. Artz
Publikováno v:
Journal of Applied Physics. 77:4954-4960
The thermal conductivity of metal‐matrix composites, which are potential electronic packaging materials, is calculated using effective medium theory and finite‐element techniques. The thermal boundary resistance, which occurs at the interface bet
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::510b04f6e2ad4f5a7b5b6cc12f45be65
https://doi.org/10.1063/1.359302
https://doi.org/10.1063/1.359302
Publikováno v:
IEEE Transactions on Electron Devices. 40:292-295
Silicon, oxidized silicon, and silicon nitride on silicon wafers were exposed to KOH etchant. Three cleaning procedures were used and the remaining surface potassium measured by C-V and SIMS techniques. Bare silicon appears to be the most difficult t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::757617120075cbeb4e975b4646afe630
https://doi.org/10.1109/16.182503
https://doi.org/10.1109/16.182503
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 11:642
This article describes the fabrication process for, and electrical characterization of, electron beam evaporated silicon field emitter arrays in a diode configuration. Each array consists of 2000 unsharpened, n‐type, polycrystalline emitters. The p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::486977dec5d10024b14bf70833a75100
https://doi.org/10.1116/1.586813
https://doi.org/10.1116/1.586813
Autor:
L. W. Cathey, B. E. Artz, B.J. Zimmerman, G. P. Myers, P. Klimecky, R. E. Elder, Heinz H. Busta, Mohammad Aslam
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 11:422
Fowler–Nordheim plots of evaporated Si cold emitter arrays, tested in triode configuration at 42 and 300 K, are found to be temperature independent. Fluctuations in emission current decrease with decreasing temperature. Pressure dependence of colle
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a8f882a7565cf6605b3c048a00c29e09
https://doi.org/10.1116/1.586875
https://doi.org/10.1116/1.586875
Publikováno v:
Advances in X-ray Analysis. 22:425-431
The Digital Equipment Corporation (DEC) operating system RSX-11M has recently been installed on a DEC PDP 11/34 computer which is used for the control of, and to acquire and process data from, three X-ray diffractometers, one X-ray fluorescence analy
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e9978a692fff3351561000fef82c72c3
https://doi.org/10.1154/s0376030800016803
https://doi.org/10.1154/s0376030800016803
Publikováno v:
Advances in X-ray Analysis. 28:177-184
X-ray fluorescence (XRF) was required to analyze vehicle exhaust particulate samples deposited on filters to determine the trace element content of the emissions. These samples were collected as part of a study to assess the role of vehicular particu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ea87e6791bf247c1f683a029105ab450
https://doi.org/10.1154/s037603080001394x
https://doi.org/10.1154/s037603080001394x
Autor:
M. J. Rokosz, B. E. Artz
Publikováno v:
Advances in X-ray Analysis. 29:477-484
Acquisition of new x—ray fluorescence (XRF) hardware or a data reduction computer can be a particularly frustrating experience for analysts who depend upon programs not supplied by the XRF spectrometer manufacturer. Computerized data collection and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7da6bad6c4f35a2705d17ed099cdb07f
https://doi.org/10.1154/s0376030800010600
https://doi.org/10.1154/s0376030800010600
Autor:
M. J. Rokosz, B. E. Artz
Publikováno v:
Advances in X-ray Analysis. 25:81-84
Methods of correction for matrix differences are required in X-ray Fluorescence (XRF) Analysis when the overall composition of the unknowns is substantially different from the available standards. Sample preparation techniques used to minimize matrix
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f380de6ab5b8a889c59d8129f117d518
https://doi.org/10.1154/s0376030800009551
https://doi.org/10.1154/s0376030800009551
Publikováno v:
Advances in X-ray Analysis. 18:309-316
An X-ray fluorescence analysis unit has been automated with a multi-position sample changer, a stepping motor to position the spectrometer, and computer addressable switches to control the selection of crystal, detector, collimator, and beam filter.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a0dbaee40af14875c4a00efe6cb9ed81
https://doi.org/10.1154/s0376030800006819
https://doi.org/10.1154/s0376030800006819
Autor:
B. E. Artz
Publikováno v:
Journal of Applied Physics. 57:2886-2891
A method is presented for determining the minority‐carrier diffusion length and surface recombination velocity in passivated, shallow junction semiconductor devices. The method is particularly useful with devices where the minority‐carrier diffus
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9585a0f0470e81e10cecf842d911d6f3
https://doi.org/10.1063/1.335225
https://doi.org/10.1063/1.335225