Zobrazeno 1 - 10
of 40
pro vyhledávání: '"B. Deveautour"'
Publikováno v:
Journal of Electronic Testing: : Theory and Applications
Journal of Electronic Testing: : Theory and Applications, 2020, 36, pp.33-46. ⟨10.1007/s10836-020-05858-5⟩
Journal of Electronic Testing
Journal of Electronic Testing, Springer Verlag, 2020, 36, pp.33-46. ⟨10.1007/s10836-020-05858-5⟩
Journal of Electronic Testing: : Theory and Applications, 2020, 36, pp.33-46. ⟨10.1007/s10836-020-05858-5⟩
Journal of Electronic Testing
Journal of Electronic Testing, Springer Verlag, 2020, 36, pp.33-46. ⟨10.1007/s10836-020-05858-5⟩
International audience; Selecting the ideal trade-off between reliability improvement and cost (i.e., area, timing and power overhead) associated with a fault tolerant architecture generally requires an extensive Design Space Exploration. In this pap
Publikováno v:
IEEE 27th International Symposium on
Testing and Robust System Design (IOLTS 2021)
Testing and Robust System Design (IOLTS 2021), Jun 2021, Torino, Italy. pp.1-7, ⟨10.1109/IOLTS52814.2021.9486699⟩
IOLTS
Testing and Robust System Design (IOLTS 2021)
Testing and Robust System Design (IOLTS 2021), Jun 2021, Torino, Italy. pp.1-7, ⟨10.1109/IOLTS52814.2021.9486699⟩
IOLTS
International audience; Until recently, Approximate Computing (AxC) was considered to be a trend topic mainly for resilient applications. Its use aimed at reducing area and power consumption of Integrated Circuits (ICs) at the cost of a reduced accur
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9b7b7753ce0b0f459fe9c5f903a93a78
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03380025
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03380025
Autor:
Sophie Dupuis, H. El Badawi, Laurent Latorre, Mariane Comte, Bruno Rouzeyre, T. Vayssadel, Arnaud Virazel, Marie-Lise Flottes, François Lefèvre, Vincent Kerzérho, Florence Azaïs, Emanuele Valea, Patrick Girard, B. Deveautour, Serge Bernard
Publikováno v:
IOLTS
26th International Symposium on
Testing and Robust System Design (IOLTS)
Testing and Robust System Design (IOLTS), Jul 2020, Napoli, Italy. pp.1-4, ⟨10.1109/IOLTS50870.2020.9159723⟩
26th International Symposium on
Testing and Robust System Design (IOLTS)
Testing and Robust System Design (IOLTS), Jul 2020, Napoli, Italy. pp.1-4, ⟨10.1109/IOLTS50870.2020.9159723⟩
International audience; Systems on a chip have seen their surface area increased by a factor of 10 and their consumption multiplied by 5 during the last ten years. Each technological node that enabled this integration has also added new constraints c
Publikováno v:
ETS
ETS 2020-IEEE European Test Symposium
ETS 2020-IEEE European Test Symposium, May 2020, Tallinn, Estonia. pp.1-6, ⟨10.1109/ETS48528.2020.9131574⟩
IEEE European Test Symposium (ETS)
IEEE European Test Symposium (ETS), May 2020, Tallinn, Estonia. pp.1-6, ⟨10.1109/ETS48528.2020.9131574⟩
ETS 2020-IEEE European Test Symposium
ETS 2020-IEEE European Test Symposium, May 2020, Tallinn, Estonia. pp.1-6, ⟨10.1109/ETS48528.2020.9131574⟩
IEEE European Test Symposium (ETS)
IEEE European Test Symposium (ETS), May 2020, Tallinn, Estonia. pp.1-6, ⟨10.1109/ETS48528.2020.9131574⟩
International audience; In the last decade, Approximate Computing has become a trend topic for several error tolerant applications. In this context, the use of such paradigm for reducing the area and power cost of conventional fault tolerant schemes
Akademický článek
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Publikováno v:
13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)
13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS), Apr 2018, Taormina, Italy. pp.1-6, ⟨10.1109/DTIS.2018.8368559⟩
2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)
DTIS 2018-13th International Conference on Design and Technology of Integrated Systems in Nanoscale Era
DTIS 2018-13th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, Apr 2018, Taormina, Italy. pp.1-6, ⟨10.1109/DTIS.2018.8368559⟩
DTIS
13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS), Apr 2018, Taormina, Italy. pp.1-6, ⟨10.1109/DTIS.2018.8368559⟩
2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)
DTIS 2018-13th International Conference on Design and Technology of Integrated Systems in Nanoscale Era
DTIS 2018-13th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, Apr 2018, Taormina, Italy. pp.1-6, ⟨10.1109/DTIS.2018.8368559⟩
DTIS
International audience; Selecting the ideal trade-off between reliability and cost associated with a fault tolerant architecture generally involves an extensive design space exploration. In this paper, we address the problem of selective hardening of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::82fbddea1c9c9bde6762f95aabc818e0
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03130537
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03130537
Publikováno v:
21th IEEE European Test Symposium
ETS: European Test Symposium
ETS: European Test Symposium, May 2016, Amsterdam, Netherlands. ⟨10.1109/ETS.2016.7519296⟩
Journal of Electronic Testing
Journal of Electronic Testing, Springer Verlag, 2017, 33 (1), pp.25-36. ⟨10.1007/s10836-017-5640-6⟩
ETS: European Test Symposium
ETS: European Test Symposium, May 2016, Amsterdam, Netherlands. ⟨10.1109/ETS.2016.7519296⟩
Journal of Electronic Testing
Journal of Electronic Testing, Springer Verlag, 2017, 33 (1), pp.25-36. ⟨10.1007/s10836-017-5640-6⟩
International audience; Selecting the ideal trade-off between reliability and cost associated with a fault tolerant architecture generally involves an extensive design space exploration. Employing state-of-the-art reliability estimation methods makes
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::aaef00d3d1277e330139c7d4bd0b1801
http://hdl.handle.net/11583/2663521
http://hdl.handle.net/11583/2663521
Publikováno v:
ETS
Selecting the ideal trade-off between reliability and cost associated with a fault tolerant architecture generally involves an extensive design space exploration. Employing state-of-the-art susceptibility estimation methods makes it unscalable with d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fae578f60b083924b66a4f618d99da04
http://hdl.handle.net/11583/2650514
http://hdl.handle.net/11583/2650514
Conference
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Conference
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