Zobrazeno 1 - 1
of 1
pro vyhledávání: '"B. D. Hoskins"'
Publikováno v:
APL Materials, Vol 6, Iss 7, Pp 070701-070701-14 (2018)
The magnitudes of the challenges facing electron-based metrology for post-CMOS technology are reviewed. Directed self-assembly, nanophotonics/plasmonics, and resistive switches and selectors are examined as exemplars of important post-CMOS technologi
Externí odkaz:
https://doaj.org/article/5ab03031701144a6aaca5e22be618f52
