Zobrazeno 1 - 10
of 40
pro vyhledávání: '"B. C. Webb"'
Autor:
A. M. Stephens, P.S. Andry, R. Horton, Sri M. Sri-Jayantha, Steven L. Wright, Katsuyuki Sakuma, Cornelia K. Tsang, Mario J. Interrante, John U. Knickerbocker, B. C. Webb, Edmund J. Sprogis, Chirag S. Patel, R. Sirdeshmukh, Anna W. Topol, B. Dang, Robert J. Polastre
Publikováno v:
IBM Journal of Research and Development. 52:553-569
Three-dimensional (3D) silicon integration of active devices with through-silicon vias (TSVs), thinned silicon, and silicon-to-silicon fine-pitch interconnections offers many product benefits. Advantages of these emerging 3D silicon integration techn
Autor:
J. Zheng, B. C. Webb, Steven L. Wright, Katsuyuki Sakuma, Edmund J. Sprogis, B. Dang, Robert J. Polastre, John U. Knickerbocker, P.S. Andry, R. Horton, Chirag S. Patel, Mario J. Interrante, Cornelia K. Tsang, Arun Sharma
Publikováno v:
IBM Journal of Research and Development. 52:599-609
Three-dimensional (3D) integration technology promises to continue enhancing integrated-circuit system performance with high bandwidth, low latency, low power, and a small form factor for a variety of applications. In this work, conventional C4 (cont
Autor:
Edmund J. Sprogis, Steven L. Wright, Katsuyuki Sakuma, R. Horton, J. Maria, P.S. Andry, Chirag S. Patel, John U. Knickerbocker, B. Dang, Robert J. Polastre, B. C. Webb, Cornelia K. Tsang, Sung K. Kang
Publikováno v:
IBM Journal of Research and Development. 52:611-622
Three-dimensional (3D) integration using through-silicon vias (TSVs) and low-volume lead-free solder interconnects allows the formation of high signal bandwidth, fine pitch, and short-distance interconnections in stacked dies. There are several appro
Autor:
B. C. Webb, Steven L. Wright, P.S. Andry, Dennis G. Manzer, Edmund J. Sprogis, B. Dang, Cornelia K. Tsang
Publikováno v:
IBM Journal of Research and Development. 52:571-581
As traditional CMOS scaling becomes progressively more difficult and less beneficial to overall system performance, three-dimensional silicon integration technologies have begun to receive considerable attention. An advanced packaging solution based
Publikováno v:
Scopus-Elsevier
Treatment of oral candidosis with topical antifungal agents such as nystatin and amphotericin B is effective initially. However, medication can produce side effects in some patients and when therapy is stopped the condition can recur. Alternative tre
Publikováno v:
Australian Dental Journal. 43:160-166
Certain systemic conditions and/or defects in the immune system may predispose the host to oral candidal infection and the commonest form of oral candidosis is candida-associated denture stomatitis. Until recently there has been controversy concernin
Autor:
Adrian W. A. Rushton, B. C. Webb, R.A. Hughes, Anthony H. Cooper, Stewart G. Molyneux, R. M. Moore
Publikováno v:
Geological Magazine. 132:185-211
A new lithostratigraphy is presented for the Skiddaw Group (lower Ordovician) of the English Lake District. Two stratigraphical belts are described. Five formations are defined in the Northern Fells Belt, ranging in age from Tremadoc to early Llanvir
Autor:
B. C. Webb, Xiaoxiong Gu, Michael R. Scheuermann, Zheng Xu, Kenneth Rose, John U. Knickerbocker, Jian-Qiang Lu
Publikováno v:
2012 IEEE 62nd Electronic Components and Technology Conference.
It is important to understand how to deliver power into 3D heterogeneous systems, which require different power supplies for different components (e.g., digital, analog, mixed-signal, MEMS parts). This paper reports on a study for a simplified case,
Autor:
Kenneth Rose, Xiaoxiong Gu, B. C. Webb, John U. Knickerbocker, Michael R. Scheuermann, Zheng Xu, Jian-Qiang Lu
Publikováno v:
2012 IEEE 62nd Electronic Components and Technology Conference.
While three-dimensional (3D) technology has several advantages for power delivery, an integrated chip-level, interposer-level, and package-level power distribution network in through-silicon-via (TSV)-based 3D system has to be modeled and evaluated.
Autor:
Christopher S. Putnam, Jian-Qiang Lu, Xiaoxiong Gu, John U. Knickerbocker, Michael R. Scheuermann, Zheng Xu, Kenneth Rose, B. C. Webb
Publikováno v:
2012 SEMI Advanced Semiconductor Manufacturing Conference.
Decoupling capacitors are essential to reduce high transient current noise and to provide a low impedance power delivery path. 3D technology has several advantages for power delivery, and this work investigates the impacts of decoupling capacitors on