Zobrazeno 1 - 10
of 129
pro vyhledávání: '"B. C. Regan"'
Autor:
Oscar Recalde-Benitez, Tianshu Jiang, Robert Winkler, Yating Ruan, Alexander Zintler, Esmaeil Adabifiroozjaei, Alexey Arzumanov, William A. Hubbard, Tijn van Omme, Yevheniy Pivak, Hector H. Perez-Garza, B. C. Regan, Lambert Alff, Philipp Komissinskiy, Leopoldo Molina-Luna
Publikováno v:
Communications Engineering, Vol 2, Iss 1, Pp 1-8 (2023)
Abstract Advanced nanomaterials are at the core of innovation for the microelectronics industry. Designing, characterizing, and testing two-terminal devices, such as metal-insulator-metal structures, is key to improving material stack design and inte
Externí odkaz:
https://doaj.org/article/67949337b138489992379497c532492b
Autor:
Yuan Hung Lo, Lingrong Zhao, Marcus Gallagher-Jones, Arjun Rana, Jared J. Lodico, Weikun Xiao, B. C. Regan, Jianwei Miao
Publikováno v:
Nature Communications, Vol 9, Iss 1, Pp 1-10 (2018)
Coherent diffractive imaging (CDI) allows for high resolution imaging without lenses. Here, Lo et al. develop in situ CDI with real-time imaging and a corresponding low-dose requirement, with expected applications in the physical and life sciences.
Externí odkaz:
https://doaj.org/article/51da7e8c1ba6408e8cee4cb94f6d5274
Publikováno v:
Nature Communications, Vol 8, Iss 1, Pp 1-9 (2017)
The common lithium-ion battery is re-charged by intercalating its graphite anode, but intercalation remains not well understood. Electron microscope video of intercalating graphite microcrystals reveals that the charge transfer occurs in current puls
Externí odkaz:
https://doaj.org/article/f87d355c50cb4dd9b244ffddbda7fc42
Publikováno v:
Nature Communications, Vol 9, Iss 1, Pp 1-1 (2018)
The Peer Review File associated with this Article was updated shortly after publication to redact confidential comments to the editor.
Externí odkaz:
https://doaj.org/article/6140a767c6d849cdb48d30b5965bdfc0
Publikováno v:
International Symposium for Testing and Failure Analysis.
Modern electronic systems rely on components with nanometer-scale feature sizes in which failure can be initiated by atomic-scale electronic defects. These defects can precipitate dramatic structural changes at much larger length scales, entirely obs
Publikováno v:
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Autor:
Brian Zutter, William A. Hubbard, Matthew Mecklenburg, Ho Leung Chan, B. C. Regan, Jared J. Lodico
Publikováno v:
Microscopy and Microanalysis. 27:2350-2352
Publikováno v:
Microscopy and Microanalysis. 28:2508-2509
Publikováno v:
Microscopy and Microanalysis. 28:794-795
Autor:
Ho Leung Chan, Shelby S Fields, Tristan O'Neill, Yueyun Chen, William A Hubbard, Jon F Ihlefeld, B C Regan
Publikováno v:
Microscopy and Microanalysis. 28:2270-2271