Zobrazeno 1 - 10
of 169
pro vyhledávání: '"B. A. Regan"'
Autor:
Oscar Recalde-Benitez, Tianshu Jiang, Robert Winkler, Yating Ruan, Alexander Zintler, Esmaeil Adabifiroozjaei, Alexey Arzumanov, William A. Hubbard, Tijn van Omme, Yevheniy Pivak, Hector H. Perez-Garza, B. C. Regan, Lambert Alff, Philipp Komissinskiy, Leopoldo Molina-Luna
Publikováno v:
Communications Engineering, Vol 2, Iss 1, Pp 1-8 (2023)
Abstract Advanced nanomaterials are at the core of innovation for the microelectronics industry. Designing, characterizing, and testing two-terminal devices, such as metal-insulator-metal structures, is key to improving material stack design and inte
Externí odkaz:
https://doaj.org/article/67949337b138489992379497c532492b
Autor:
Yuan Hung Lo, Lingrong Zhao, Marcus Gallagher-Jones, Arjun Rana, Jared J. Lodico, Weikun Xiao, B. C. Regan, Jianwei Miao
Publikováno v:
Nature Communications, Vol 9, Iss 1, Pp 1-10 (2018)
Coherent diffractive imaging (CDI) allows for high resolution imaging without lenses. Here, Lo et al. develop in situ CDI with real-time imaging and a corresponding low-dose requirement, with expected applications in the physical and life sciences.
Externí odkaz:
https://doaj.org/article/51da7e8c1ba6408e8cee4cb94f6d5274
Publikováno v:
Nature Communications, Vol 8, Iss 1, Pp 1-9 (2017)
The common lithium-ion battery is re-charged by intercalating its graphite anode, but intercalation remains not well understood. Electron microscope video of intercalating graphite microcrystals reveals that the charge transfer occurs in current puls
Externí odkaz:
https://doaj.org/article/f87d355c50cb4dd9b244ffddbda7fc42
Publikováno v:
Lecture Notes in Electrical Engineering ISBN: 9789811971686
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7e2ebab3ae976cf2d0546eff83b75b70
https://doi.org/10.1007/978-981-19-7169-3_27
https://doi.org/10.1007/978-981-19-7169-3_27
Publikováno v:
International Symposium for Testing and Failure Analysis.
Modern electronic systems rely on components with nanometer-scale feature sizes in which failure can be initiated by atomic-scale electronic defects. These defects can precipitate dramatic structural changes at much larger length scales, entirely obs
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6244b52d2547247877c53cd3a38b04f1
https://doi.org/10.31399/asm.cp.istfa2022p0251
https://doi.org/10.31399/asm.cp.istfa2022p0251
Publikováno v:
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f1a69e7fe631ded6ebc174fab02f09f
https://doi.org/10.1109/ipfa55383.2022.9915733
https://doi.org/10.1109/ipfa55383.2022.9915733
Autor:
Xin Yi Ling, Jared J. Lodico, Graydon J. K. Flatt, Bozo Vareskic, B. C. Regan, Matthew Mecklenburg, Gurleen Bal, W. Andrew Kessel, Brian Zutter, Roshni Patil, Ho Leung Chan, William A. Hubbard, Yueyun Chen
Publikováno v:
ACS Nano. 14:11510-11517
More efficient thermoelectric devices would revolutionize refrigeration and energy production, and low-dimensional thermoelectric materials are predicted to be more efficient than their bulk counterparts. But nanoscale thermoelectric devices generate
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::01f9258ec5c75bf558cc50682385f1a5
https://doi.org/10.1021/acsnano.0c03958
https://doi.org/10.1021/acsnano.0c03958
Publikováno v:
Microscopy and Microanalysis. 28:794-795
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::046746f526631ce1aa85ab853aedadd9
https://doi.org/10.1017/s1431927622003580
https://doi.org/10.1017/s1431927622003580
Autor:
Ho Leung Chan, Shelby S Fields, Tristan O'Neill, Yueyun Chen, William A Hubbard, Jon F Ihlefeld, B C Regan
Publikováno v:
Microscopy and Microanalysis. 28:2270-2271
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d7170537c19aba38c476db68d27927d8
https://doi.org/10.1017/s1431927622008728
https://doi.org/10.1017/s1431927622008728
Publikováno v:
Microscopy and Microanalysis. 28:576-577
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::952010f747a88f2ea6f14c50d188a869
https://doi.org/10.1017/s1431927622002884
https://doi.org/10.1017/s1431927622002884