Zobrazeno 1 - 10
of 26
pro vyhledávání: '"B. R. Rogers"'
Autor:
Sichang Lu, Scott A. Guelcher, Joseph C. Wenke, B. R. Rogers, Madison A.P. McGough, Daniel A. Shimko
Bone cements for treatment of fractures at weight-bearing sites are subjected to dynamic physiological loading from daily activities. An ideal bone cement rapidly sets after injection, exhibits bone-like strength, stimulates osteogenic differentiatio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e988417e42464bf6d9e40584b8db1ca9
https://europepmc.org/articles/PMC6086367/
https://europepmc.org/articles/PMC6086367/
Publikováno v:
ECS Transactions. 28:97-103
An effective technique to fabricate thin-film carbon nanotube (CNT)/manganese dioxide (MnO2) composite material is developed for electrochemical supercapacitor applications. Cyclic voltammetry and galvanostatic charging-discharging experiments indica
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::69364cac2afb7b48ceaa2ba06e1e42d5
https://doi.org/10.1149/1.3490687
https://doi.org/10.1149/1.3490687
Autor:
Dina H. Triyoso, Jerry L. Whitten, Stefan Zollner, Valery V. Afanas'ev, B. R. Rogers, Jan Lüning, Gerald Lucovsky, Andre Stesmans, Y. Zhang
Publikováno v:
Microelectronic Engineering. 80:110-113
Chemically pure thin films of HfO2, as well as other transition metal and rare earth elemental and complex oxides, e.g., LaScO3 and LaAlO3, are nanocrystalline as-deposited. The local bonding environments of the transition and rare earth atoms are di
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::426d1e759104db798c54511823b2bd33
https://doi.org/10.1016/j.mee.2005.04.052
https://doi.org/10.1016/j.mee.2005.04.052
Autor:
Valery V. Afanas'ev, Jerry L. Whitten, B. R. Rogers, Jan Lüning, Robert J. Nemanich, Gerald Lucovsky, Y. Zou, Lisa F. Edge, Harald Ade, Y. Zhang, Darrell G. Schlom, C. C. Fulton, Dina H. Triyoso, Andre Stesmans, Stefan Zollner
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 5:65-83
X-ray absorption spectroscopy (XAS) is used to study band edge electronic structure of high-/spl kappa/ transition metal (TM) and trivalent lanthanide rare earth (RE) oxide gate dielectrics. The lowest conduction band d/sup */-states in TiO/sub 2/, Z
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e2a3a56bff03ed3e47bdab9fe2cb2b0e
https://doi.org/10.1109/tdmr.2005.845804
https://doi.org/10.1109/tdmr.2005.845804
Publikováno v:
Journal of Materials Research. 14:1982-1989
We discuss substrate temperature ramping effects during chemical vapor deposition of aluminum on nucleation density, texture, surface roughness, and resistivity of the resulting films. Results from three different process protocols are presented. Ram
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f1b8cfe160f1bd55da7aa62bc628ce7
https://doi.org/10.1557/jmr.1999.0267
https://doi.org/10.1557/jmr.1999.0267
Publikováno v:
Thin Solid Films. 332:312-318
The effects of temperature, substrate type and diluent gas flow trajectories on the film growth rate, surface roughness, crystal orientation, average grain size, and grain size uniformity of tri-isobutyl aluminum (TIBA) sourced CVD aluminum films wer
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::26ae5f54589997ee41d1cae272c0574f
https://doi.org/10.1016/s0040-6090(98)01034-7
https://doi.org/10.1016/s0040-6090(98)01034-7
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 16:1227-1232
X-ray photoelectron spectroscopy (XPS) was used to study the surface oxidation of sputtered and electroplated copper films following exposure to ambient air and chemical processing reagents used during the fabrication of interconnect structures. Expo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d247775e5c2c1adde96bb57ce4923f7b
https://doi.org/10.1116/1.581264
https://doi.org/10.1116/1.581264
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 14:1142-1146
We used experiments and physically based process simulations to study the re‐emission of Ti and W during sputter deposition of Ti–W films and Ti during the sputter deposition of Ti films. Ti–W thin films have previously been shown to become Ti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::39586b956726530234fe86ffe3be111a
https://doi.org/10.1116/1.580284
https://doi.org/10.1116/1.580284
Autor:
B. R. Rogers, Timothy S. Cale
Publikováno v:
Thin Solid Films. 236:334-340
We compare experimentally measured and simulated spatial composition variation in a TiW film sputtered into trenches on a patterned silicon wafer. Composition as a function of position down sidewalls of partially filled features of various aspect
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3da1dddc295534a14b1957b2ff40417b
https://doi.org/10.1016/0040-6090(93)90692-i
https://doi.org/10.1016/0040-6090(93)90692-i
Autor:
B. R. Rogers
Publikováno v:
Surface and Interface Analysis. 18:173-177
Compositional variation in chemical vapor deposited tungsten silicide films in confined spaces has been studied using scanning Auger electron spectroscopy. «Infinitely» long silicon trenches with aspect ratios ranging between 1.5 and 5 were used to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4cc2d7e8b44498634b649a7252a9890d
https://doi.org/10.1002/sia.740180219
https://doi.org/10.1002/sia.740180219