Zobrazeno 1 - 10
of 62
pro vyhledávání: '"B SAMPATH KUMAR"'
Autor:
SUBRATA KUMAR MANDAL, B SAMPATH KUMAR
Publikováno v:
The Indian Journal of Agricultural Sciences, Vol 93, Iss 3 (2023)
The uninterrupted availability and price of electric power is a great solicitude for a common man; thus, irregular power availability for irrigation is a daily problem faced by rural farmers. In most rural communities, hand-operated water pumps are v
Externí odkaz:
https://doaj.org/article/cc626e20380d4a2b91d3dd42534010a1
Publikováno v:
Indian Journal of Animal Sciences, Vol 89, Iss 5 (2019)
As the body temperature of birds rise, growth and production parameters tend to decline. In order to address the problem of heat stress, an experiment was conducted to investigate the effect of different herbal immunomodulators on the haemobiochemica
Externí odkaz:
https://doaj.org/article/afedb8e5058d4880b55bf59507b86bd2
Autor:
B. Sampath Kumar, D. Bhanu Sree Reddy
Publikováno v:
International Journal on Recent and Innovation Trends in Computing and Communication. 10:99-105
With the great extent of use of smartphones and the internet, the online hotel booking service providers have excessively increased thus producing more user-generated content in the form of reviews and comments about the customer experience. These re
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1d318e6c8aee73c63610dd3a9c8973af
https://doi.org/10.17762/ijritcc.v10i2s.5916
https://doi.org/10.17762/ijritcc.v10i2s.5916
Publikováno v:
Veterinary World, Vol 9, Iss 4, Pp 410-416 (2016)
Aim: The aim of this study is to test the potency of bovine serum albumin (BSA) conjugated ampicillin (AMP) and enrofloxacin (ENR) antigens in eliciting an immune response in rats using indirect competitive enzyme-linked immunosorbent assay (icELISA)
Externí odkaz:
https://doaj.org/article/d6810fa531454927b4f6897accef5302
Publikováno v:
Sustainable Agriculture Reviews 59 ISBN: 9783031216299
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c82a09ab63cd2a63777a1eae60ba199b
https://doi.org/10.1007/978-3-031-21630-5_6
https://doi.org/10.1007/978-3-031-21630-5_6
Introduction A Wound is a split in the epithelial integrity of the skin including deeper punctures with disruption ending to the dermis, subcutaneous fat, fascia, muscle or even bone (Enoch and Price, 2004). Wound healing involves a series of cellula
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2214aa8dc123e57babb3a1d589bd7dd1
Publikováno v:
IEEE Transactions on Electron Devices. 67:4728-4735
This article explores the scope of drain-extended FinFET (DeFinFET) as a high-voltage (HV) device contender for Fin-based SoC applications. For the first time, guidelines for efficient and reliable HV integration in sub-14 nm FinFET nodes are given.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a6bb1baa048e81da016c0b46aa54a617
https://doi.org/10.1109/ted.2020.3020904
https://doi.org/10.1109/ted.2020.3020904
Publikováno v:
IEEE Transactions on Electron Devices. 67:2717-2724
Single and multi-Fin behavior of drain-extended FinFET (DeFinFET) devices under low and high current injection conditions is studied using detailed 3-D TCAD simulations. For completeness, electrostatic discharge (ESD) behavior of both shallow trench
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::55128c75fc48b26ac909adcaaf2e4bbc
https://doi.org/10.1109/ted.2020.2994170
https://doi.org/10.1109/ted.2020.2994170
Publikováno v:
IEEE Transactions on Electron Devices. 67:2745-2751
This article presents a simultaneous impact of selective contact silicidation, silicide, and junction engineering on bulk FinFET’s electrostatic discharge (ESD) reliability, latch-up (LU) robustness, and hot carrier-induced (HCI) degradation. The i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4344b8608abeb5d3a24188fe2e73aaa3
https://doi.org/10.1109/ted.2020.2997757
https://doi.org/10.1109/ted.2020.2997757
Autor:
Milova Paul, Harald Gossner, Pulkit Singhal, Kranthi Karmel Nagothu, Mayank Shrivastava, B. Sampath Kumar
Publikováno v:
IEEE Transactions on Electron Devices. 66:5072-5079
This article presents device design insights and design challenges for drain-extended FinFET devices with embedded silicon-controlled rectifier (SCR) (DeFinFET-SCR), which can be used as an electrostatic discharge (ESD) protection device and a self-p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a40fe681cb4a262ecc8e746f964f7f3f
https://doi.org/10.1109/ted.2019.2949126
https://doi.org/10.1109/ted.2019.2949126