Zobrazeno 1 - 7
of 7
pro vyhledávání: '"B R A Neves"'
Publikováno v:
Cerâmica, Vol 44, Iss 290, Pp 212-219 (1998)
A análise estrutural de materiais experimentou um grande avanço nos últimos anos, associado ao desenvolvimento das técnicas de Microscopia de Varredura por Sonda Mecânica, surgidas na década passada e consolidadas nos anos 90. Trata-se de um en
Externí odkaz:
https://doaj.org/article/8d4d458b894d4b189edceaece913686b
Publikováno v:
Microscopy Research and Technique. 65:159-165
Transparent objects (phase objects) are not visible in a standard brightfield optical microscope. In order to see such objects the most used technique is phase-contrast microscopy. In phase-contrast microscopy the contrast observed is proportional to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a63413bb73b99b8cfc55a9228b4b3257
https://doi.org/10.1002/jemt.20117
https://doi.org/10.1002/jemt.20117
Publikováno v:
Cerâmica, Vol 44, Iss 290, Pp 212-219 (1998)
Cerâmica, Volume: 44, Issue: 290, Pages: 212-219, Published: DEC 1998
Cerâmica v.44 n.290 1998
Cerâmica (São Paulo. Online)
Universidade de São Paulo (USP)
instacron:USP
Cerâmica, Volume: 44, Issue: 290, Pages: 212-219, Published: DEC 1998
Cerâmica v.44 n.290 1998
Cerâmica (São Paulo. Online)
Universidade de São Paulo (USP)
instacron:USP
A análise estrutural de materiais experimentou um grande avanço nos últimos anos, associado ao desenvolvimento das técnicas de Microscopia de Varredura por Sonda Mecânica, surgidas na década passada e consolidadas nos anos 90. Trata-se de um en
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::54e6000b8f7032c791ad231ffcb86811
http://www.scielo.br/scielo.php?script=sci_arttext&pid=S0366-69131998000600002
http://www.scielo.br/scielo.php?script=sci_arttext&pid=S0366-69131998000600002
Publikováno v:
Hot Carriers in Semiconductors ISBN: 9781461380351
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ef8f9a8c213bbef451ed96e641918d74
https://doi.org/10.1007/978-1-4613-0401-2_120
https://doi.org/10.1007/978-1-4613-0401-2_120
Akademický článek
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Autor:
M. S. Andrade, B. R. A. Neves
Publikováno v:
Microscopy and Microanalysis. 5:44-45
In this work, we report on the observation of two coexisting patterns in Magnetic Force Microscopy (MFM) images of shape memory alloys. The MFM signal of both patterns presents similar behavior with tip-surface separation. An investigation on the ori
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9e576253d97828e34848e1fff4691c10
https://doi.org/10.1017/s1431927600013544
https://doi.org/10.1017/s1431927600013544
Autor:
E Mania, A B Alencar, A R Cadore, B R Carvalho, K Watanabe, T Taniguchi, B R A Neves, H Chacham, L C Campos
Publikováno v:
2D Materials; Sep2017, Vol. 4 Issue 3, p1-1, 1p