Zobrazeno 1 - 10
of 13
pro vyhledávání: '"B Jaya Krishna"'
Publikováno v:
Materials Today: Proceedings. 46:3882-3887
The Aim of the project is to communicate through Black spot, Black spot is the area where the signal is not found. From the black spot transmission or receiving of information is difficult. Here the project is useful to create a signal and to transmi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7389ca2e6a3f885ccc51f6934f12ca60
https://doi.org/10.1016/j.matpr.2021.02.339
https://doi.org/10.1016/j.matpr.2021.02.339
Autor:
Sk Gopi Subhanvali, R Siva Prakash, P Samivulla Khan, R Rahul Salmon, D. Eswar Tony, Rama Rao Nadendla, P Trinadh, B Jaya Krishna
Publikováno v:
International Research Journal Of Pharmacy. 11:9-14
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2607a535c5bc883250cb069e2d6e3ca1
https://doi.org/10.7897/2230-8407.110977
https://doi.org/10.7897/2230-8407.110977
Autor:
Y. Bhavani, B. Jaya Krishna
Publikováno v:
Advances in Intelligent Systems and Computing ISBN: 9789811512742
In today’s world, providing data security is a primary concern. For this purpose, many researchers have introduced asymmetric and symmetric algorithms to ensure security. But they are not resistant to many attacks. In this paper, we combine symmetr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a99daa3ddb1b9f5b5d46bc12973d136b
https://doi.org/10.1007/978-981-15-1275-9_15
https://doi.org/10.1007/978-981-15-1275-9_15
Publikováno v:
2019 Third International conference on I-SMAC (IoT in Social, Mobile, Analytics and Cloud) (I-SMAC).
Today the frequency of technological transformations is very high. In order to cope up with these, there is a demand for fast processing and secured algorithms should be proposed for data exchange. In this paper, Advanced Encryption Standard (AES) is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f7ef2f3421508a6aeb5841e0ab4d5819
https://doi.org/10.1109/i-smac47947.2019.9032516
https://doi.org/10.1109/i-smac47947.2019.9032516
Autor:
M. Chandra Shekar, B. Jaya Krishna, A. Bhoomaiah, P.V. Kanaka Rao, B.P. Singh, P. Appala Naidu
Publikováno v:
2007 Electrical Insulation Conference and Electrical Manufacturing Expo.
Insulation failure within transformer winding is considered to be one of the most important causes of failure of the power transformer. Comparison of neutral currents at reduced and full voltages is an important criterion for detection of fault in th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ddafeb4fab65c9eba164f392b9c1f683
https://doi.org/10.1109/eeic.2007.4562577
https://doi.org/10.1109/eeic.2007.4562577
Kniha
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Conference
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Publikováno v:
Personal & Ubiquitous Computing; Jun2023, Vol. 27 Issue 3, p1321-1334, 14p
Publikováno v:
Journal of Thermal Science; May2023, Vol. 32 Issue 3, p1213-1226, 14p
Autor:
SRIDHAR, Patthi1 sridharp35@gmail.com, SINGH, Birendra Prasad2 bpsingh101@gmail.com, RAO, Pulapa Venkata Kanaka3 pvkanakarao@gmail.com
Publikováno v:
Turkish Journal of Electrical Engineering & Computer Sciences. Nov2012, Vol. 20 Issue 6, p835-841. 7p.