Zobrazeno 1 - 8
of 8
pro vyhledávání: '"B J Eves"'
Publikováno v:
Measurement Science and Technology. 29:125006
An uncertainty budget for measuring the roundness of high-quality parts using the reversal method has been developed. A systematic source of uncertainty due to the non-linear nature of the and operators has been experimentally verified and a simple m
A self-consistent method for determining line-width and probe shape using an atomic force microscope (AFM) has been developed. Through acquisition of three images in which one tip images the other, and each tip images the sample a least-squares deter
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5761941e327bf811dc5fe3726da4eef5
https://nrc-publications.canada.ca/eng/view/object/?id=17d707e2-386b-4b84-8a4b-1763c01cc5b0
https://nrc-publications.canada.ca/eng/view/object/?id=17d707e2-386b-4b84-8a4b-1763c01cc5b0
Autor:
B J Eves
An autocollimator calibration facility has been developed based upon both a precision rotary table and a sine-bar. The traceability of the system is through sub-division of the circle and hence to the SI unit of angle, and does not require traceabili
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::85fe193af91fd333b33099506c8d242e
https://nrc-publications.canada.ca/eng/view/object/?id=0bf8bb9b-b5f4-4274-97c2-bc6a7c000470
https://nrc-publications.canada.ca/eng/view/object/?id=0bf8bb9b-b5f4-4274-97c2-bc6a7c000470
Measurement of grating pitch by optical diffraction is one of the few methods currently available for establishing traceability to the definition of the meter on the nanoscale; therefore, understanding all aspects of the measurement is imperative for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ceaea72c278aedd500682c29c9bea589
https://nrc-publications.canada.ca/eng/view/object/?id=1bf37c29-ef8c-49b4-9873-c89e391b150d
https://nrc-publications.canada.ca/eng/view/object/?id=1bf37c29-ef8c-49b4-9873-c89e391b150d
Autor:
J R Pekelsky, S. Wingar, Shan Zou, B J Eves, D. Goodchild, Linda J. Johnston, N. Kim, Jennifer E. Decker, David Munoz-Paniagua, Mark T. McDermott, A. Bogdanov
Publikováno v:
Nanotechnology in Construction 3 ISBN: 9783642009792
Nanotechnology emerges out of fundamental science through capability for accurate, repeatable and reproducible measurements on the nanoscale which allows scientists and engineers to accumulate knowledge. Understanding the measurement science is the f
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c44333b2dceb6204a21cec01d50b7928
https://doi.org/10.1007/978-3-642-00980-8_8
https://doi.org/10.1007/978-3-642-00980-8_8
Autor:
B J Eves, A. Kueng, S. P. Pan, B. C. Yao, A. Diener, James R. Pekelsky, F. Meli, Jennifer E. Decker, Egbert Buhr
This paper reports results of an international comparison of one-dimensional (1D) grating pitch calibration by optical diffraction. Comparison results are analysed and discussed following the recommended guidelines for the analysis of CIPM key compar
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fb101c466d7c8cade7867480fce3dfcd
https://nrc-publications.canada.ca/eng/view/object/?id=23b07ca4-30fa-425e-b10d-3ed8477ade92
https://nrc-publications.canada.ca/eng/view/object/?id=23b07ca4-30fa-425e-b10d-3ed8477ade92
A laser diffractometer for calibrating grating pitch is being developed at the National Research Council (NRC). Based on the METAS design, it features a precision rotary table, the sample grating mounted in Littrow configuration, a collimated spatial
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::94db41a1c0ce3b76553a338702be93eb
https://nrc-publications.canada.ca/eng/view/object/?id=88041e7b-c9be-4a05-92f5-af5b15f213c2
https://nrc-publications.canada.ca/eng/view/object/?id=88041e7b-c9be-4a05-92f5-af5b15f213c2
Autor:
B. J. Eves, O. Hul’ko, T. R. Ward, R. Boukherroub, S. N. Patitsas, C. Mark, Gregory P. Lopinski
Chlorine termination of low-doped, n-type Si(111) is found to lead to an increase in conductance relative to the hydrogen-terminated surface. This increase is attributed to formation of an inversion layer due to the strongly electron withdrawing char
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2992fbd469698a222832f6dfa2dfd0f5
https://doi.org/10.1103/physrevb.71.125308
https://doi.org/10.1103/physrevb.71.125308