Zobrazeno 1 - 10
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pro vyhledávání: '"Bürgi, T."'
Autor:
Obstarczyk P; Institute of Advanced Materials, Wroclaw University of Science and Technology, Wybrzeże Stanisława Wyspiańskiego 27, Wrocław 50-344, Poland., Kazan R; Département de Chimie Physique, Université de Genève, 30 Quai Ernest Ansermet, CH-1211 Genève 4, Geneva,Switzerland., Bürgi T; Département de Chimie Physique, Université de Genève, 30 Quai Ernest Ansermet, CH-1211 Genève 4, Geneva,Switzerland., Samoć M; Institute of Advanced Materials, Wroclaw University of Science and Technology, Wybrzeże Stanisława Wyspiańskiego 27, Wrocław 50-344, Poland., Olesiak-Bańska J; Institute of Advanced Materials, Wroclaw University of Science and Technology, Wybrzeże Stanisława Wyspiańskiego 27, Wrocław 50-344, Poland.
Publikováno v:
Journal of the American Chemical Society [J Am Chem Soc] 2024 Dec 25; Vol. 146 (51), pp. 35011-35015. Date of Electronic Publication: 2024 Dec 10.
Autor:
Mühlig, S., Cunningham, A., Dintinger, J., Farhat, M., Hasan, S. Bin, Scharf, T., Bürgi, T., Lederer, F., Rockstuhl, C.
In a recent comment arxiv:1310.1503 Miller et al. noted that a cloak we previously presented (Scientific Reports 3, 2328) that exploits a scattering cancellation technique to render an optically small dielectric particle invisible suffers from increa
Externí odkaz:
http://arxiv.org/abs/1310.5888
Autor:
Ziarati A; Department of Physical Chemistry, University of Geneva, 30 Quai Ernest-Ansermet,1211, Geneva 4, Switzerland., Gotfredsen H; Department of Chemistry, University of Oxford, Chemistry Research Laboratory, Oxford OX1 3TA, UK., Rosspeintner A; Department of Physical Chemistry, University of Geneva, 30 Quai Ernest-Ansermet,1211, Geneva 4, Switzerland., Zhao J; Department of Physical Chemistry, University of Geneva, 30 Quai Ernest-Ansermet,1211, Geneva 4, Switzerland., Anderson HL; Department of Chemistry, University of Oxford, Chemistry Research Laboratory, Oxford OX1 3TA, UK., Bürgi T; Department of Physical Chemistry, University of Geneva, 30 Quai Ernest-Ansermet,1211, Geneva 4, Switzerland.
Publikováno v:
Angewandte Chemie (International ed. in English) [Angew Chem Int Ed Engl] 2024 Oct 21, pp. e202414908. Date of Electronic Publication: 2024 Oct 21.
Autor:
Martin K; Univ Angers, CNRS, MOLTECH-Anjou SFR MATRIX, F-49000, Angers, France., Aharon T; Department of Chemistry, University of Kansas, 1567 Irving Hill Road, Lawrence, Kansas, 66045, United States of America.; TetraScience, 294 Washington St, Boston, MA 02108, United States of America., Mastropasqua Talamo M; Univ Angers, CNRS, MOLTECH-Anjou SFR MATRIX, F-49000, Angers, France., Hauser A; Department of Physical Chemistry, University of Geneva, 30 Quai Ernest Ansermet, CH-1211, Geneva, Switzerland., Bürgi T; Department of Physical Chemistry, University of Geneva, 30 Quai Ernest Ansermet, CH-1211, Geneva, Switzerland., Vanthuyne N; Aix Marseille Univ, CNRS, Centrale Marseille UAR, 1739, FSCM, Chiropole, Marseille, France., Caricato M; Department of Chemistry, University of Kansas, 1567 Irving Hill Road, Lawrence, Kansas, 66045, United States of America., Avarvari N; Univ Angers, CNRS, MOLTECH-Anjou SFR MATRIX, F-49000, Angers, France.
Publikováno v:
Chemistry (Weinheim an der Bergstrasse, Germany) [Chemistry] 2024 Jul 25; Vol. 30 (42), pp. e202401413. Date of Electronic Publication: 2024 Jul 03.
Akademický článek
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Publikováno v:
In Current Applied Physics March 2015 15(3):253-260
Autor:
Kudashev A; University of Basel, Department of Chemistry, St. Johanns-Ring 19, 4056, Basel, Switzerland., Vergura S; University of Basel, Department of Chemistry, St. Johanns-Ring 19, 4056, Basel, Switzerland., Zuccarello M; University of Basel, Department of Chemistry, St. Johanns-Ring 19, 4056, Basel, Switzerland., Bürgi T; University of Geneva, Department of Physical Chemistry, 30 Quai Ernest-Ansermet, 1211, Geneva 4, Switzerland., Baudoin O; University of Basel, Department of Chemistry, St. Johanns-Ring 19, 4056, Basel, Switzerland.
Publikováno v:
Angewandte Chemie (International ed. in English) [Angew Chem Int Ed Engl] 2024 Jan 02; Vol. 63 (1), pp. e202316103. Date of Electronic Publication: 2023 Nov 30.
Autor:
Zhao J; Department of Physical Chemistry, University of Geneva, 30 Quai Ernest-Ansermet, 1211, Geneva 4, Switzerland., Ziarati A; Department of Physical Chemistry, University of Geneva, 30 Quai Ernest-Ansermet, 1211, Geneva 4, Switzerland., Rosspeintner A; Department of Physical Chemistry, University of Geneva, 30 Quai Ernest-Ansermet, 1211, Geneva 4, Switzerland., Bürgi T; Department of Physical Chemistry, University of Geneva, 30 Quai Ernest-Ansermet, 1211, Geneva 4, Switzerland.
Publikováno v:
Angewandte Chemie (International ed. in English) [Angew Chem Int Ed Engl] 2024 Jan 02; Vol. 63 (1), pp. e202316649. Date of Electronic Publication: 2023 Nov 30.
Autor:
Wang X; Department of Physical Chemistry, University of Geneva, 4, 1211 Geneva, Switzerland., Zhao J; Department of Physical Chemistry, University of Geneva, 4, 1211 Geneva, Switzerland., Eliasson H; Electron Microscopy Center, Empa, Swiss Federal Laboratories for Materials Science and Technology, Überlandstrasse 129, 8600 Dübendorf, Switzerland., Erni R; Electron Microscopy Center, Empa, Swiss Federal Laboratories for Materials Science and Technology, Überlandstrasse 129, 8600 Dübendorf, Switzerland., Ziarati A; Department of Physical Chemistry, University of Geneva, 4, 1211 Geneva, Switzerland., Mckeown Walker S; Department of Quantum Matter Physics, University of Geneva, 1211 Geneva 4, Switzerland.; Laboratory of Advanced Technology, University of Geneva, 4, 1211 Geneva, Switzerland., Bürgi T; Department of Physical Chemistry, University of Geneva, 4, 1211 Geneva, Switzerland.
Publikováno v:
Journal of the American Chemical Society [J Am Chem Soc] 2023 Dec 20; Vol. 145 (50), pp. 27273-27281. Date of Electronic Publication: 2023 Dec 08.
Autor:
Bouhekka, A., Bürgi, T.
Publikováno v:
In Applied Surface Science 15 November 2012 261:369-374