Zobrazeno 1 - 10
of 769
pro vyhledávání: '"Béché, A."'
Publikováno v:
SciPost Phys. 15, 223 (2023)
We present a 48-element programmable phase plate for coherent electron waves produced by a combination of photolithography and focused ion beam. This brings the highly successful concept of wavefront shaping from light optics into the realm of electr
Externí odkaz:
http://arxiv.org/abs/2308.16304
Autor:
Gastebois, J., Coulon, N., Cormerais, H., Levallois, C., Bêche, E., Esvan, J., Moréac, A., Lhermite, H., Garnier, L., Bêche, B.
Publikováno v:
In Materials Today Communications June 2024 39
Autor:
Vijayakumar, Jaianth, Savchenko, Tatiana M., Bracher, David M., Lumbeeck, Gunnar, Béché, Armand, Verbeeck, Jo, Vajda, Štefan, Nolting, Frithjof, Vaz, C. A. F., Kleibert, Armin
We present a detailed atomistic picture of the oxidation mechanism of Co nanoparticles and its impact on magnetism by experimentally following the evolution of the structure, chemical composition, and magnetism of individual, gas-phase grown Co nanop
Externí odkaz:
http://arxiv.org/abs/2209.06949
Ptychography provides highly efficient imaging in scanning transmission electron microscopy (STEM), but questions have remained over its applicability to strongly scattering samples such as those most commonly seen in materialsscience. Although contr
Externí odkaz:
http://arxiv.org/abs/2205.13308
Publikováno v:
Microsc. Microanal. 29-1 (2023) 341-351
Current progress in programmable electrostatic phase plates raises questions about their usefulness for specific applications. Here, we explore different designs for such phase plates with the specific goal of correcting spherical aberration in the T
Externí odkaz:
http://arxiv.org/abs/2205.07697
Publikováno v:
In Results in Chemistry June 2024 8
Autor:
Jannis, Daen, Hofer, Christoph, Gao, Chuang, Xie, Xiaobin, Béché, Armand, Pennycook, Timothy J., Verbeeck, Jo
Four dimensional scanning transmission electron microscopy (4D STEM) records the scattering of electrons in a material in great detail. The benefits offered by 4D STEM are substantial, with the wealth of data it provides facilitating for instance hig
Externí odkaz:
http://arxiv.org/abs/2107.02864
The highly energetic electrons in a transmission electron microscope (TEM) can alter or even completely destroy the structure of samples before sufficient information can be obtained. This is especially problematic in the case of zeolites, organic an
Externí odkaz:
http://arxiv.org/abs/2105.01617
In this second part of a series we attempt to construct an empirical model that can mimick all experimental observations made regarding the role of an alternative interleaved scan pattern in STEM imaging on the beam damage in a specific zeolite sampl
Externí odkaz:
http://arxiv.org/abs/2104.14992
Autor:
Vanrompay, Hans, Skorikov, Alexander, Bladt, Eva, Béché, Armand, Freitag, Bert, Verbeeck, Jo, Bals, Sara
Electron tomography is a widely used experimental technique for analyzing nanometer-scale structures of a large variety of materials in three dimensions. Unfortunately, the acquisition of conventional electron tomography tilt series can easily take u
Externí odkaz:
http://arxiv.org/abs/2009.14512