Plasma FIB-SEM-based Kintsugi Imaging of Battery Electrodes

Autor: B Winiarski, SJ Cooper, SA Roberts, Z Liu

Publikováno v: Microscopy and Microanalysis. 28:86-87

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::aa012f674fd21f304016c1ee9cebcb49
https://doi.org/10.1017/s1431927622001258

Plasma FIB Spin Milling for 3D Residual Stress Measurements

Autor: B. Winiarski, Philip J. Withers, C. Rue

Publikováno v: Microscopy and Microanalysis. 25:882-883

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::fc7fa5737c467f76dbd2e380147c5086
https://doi.org/10.1017/s1431927619005142

Xe+ Plasma FIB: 3D Microstructures from Nanometers to Hundreds of Micrometers

Autor: Isabel N. Boona, R. Kelley, M.G. Burke, K. Mani, B. Winiarski, Philip J. Withers, David W. McComb, Timothy L. Burnett, X. L. Zhong

Publikováno v: Burnett, T, Winiarski, B, Kelley, R, Zhong, X L, Boona, I N, McComb, D W, Mani, K, Burke, M G & Withers, P 2016, ' Xe + Plasma FIB: 3D Microstructures from Nanometers to Hundreds of Micrometers ', Microscopy Today, vol. 24, no. 3, pp. 32-37 . https://doi.org/10.1017/S1551929516000316

Xenon plasma focused ion beam (FIB) technology has the potential to investigate large volumes, hundreds of micrometers in size whilst retaining the high resolution of SEM imaging. Three different materials, an aluminum alloy, a zirconium-based metall

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::99fb1fcd14e62d8d5e6da00ce3bf1334
https://pure.manchester.ac.uk/ws/files/48185198/BurnettPFIB2015_final3_CEL.doc

High Spatial Resolution Evaluation of Residual Stresses in Shot Peened Specimens Containing Sharp and Blunt Notches by Micro-hole Drilling, Micro-slot Cutting and Micro-X-ray Diffraction Methods

Autor: B. Winiarski, Matteo Benedetti, Vigilio Fontanari, Philip J. Withers, Jay C. Hanan, Masoud Allahkarami

Publikováno v: Winiarski, B, Benedetti, M, Fontanari, V, Allahkarami, M, Hanan, J C & Withers, P J 2016, ' High Spatial Resolution Evaluation of Residual Stresses in Shot Peened Specimens Containing Sharp and Blunt Notches by Micro-hole Drilling, Micro-slot Cutting and Micro-X-ray Diffraction Methods ', Experimental Mechanics, pp. 1-15 . https://doi.org/10.1007/s11340-016-0182-x

The moderately high lateral RS gradients (on the order of tens of MPa/μm) near shot peened notches in conjunction with the shallow treatment depth (some hundreds of microns) limit the application of far-field and/or high resolution synchrotron diffr

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c0ec73609d29eda0c607182167b8e329
http://www.springer.com/dal/home/generic/search/results?SGWID=1-40109-70-36417762-0

Effects of Cooling Rates on Glass Formation and Magnetic Behavior for the Fe73.0C7.0Si3.3B5.0P8.7Mo3.0 Bulk Metallic Glass

Autor: Zhaoping Lu, B. Winiarski, Feng Jiang, Li Hong, J. E. Gao, Philip J. Withers, Peter K. Liaw

Publikováno v: Metallurgical and Materials Transactions A. 44:2004-2009

In this paper, effects of cooling rates on glass formation and magnetic behavior of the Fe73.0C7.0Si3.3B5.0P8.7Mo3.0 (at. pct) alloy were investigated via different purging gases (i.e., helium and argon) during suction casting. X-ray diffraction patt

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::1850fa0228598ef207006eaf88d47ef9
https://doi.org/10.1007/s11661-012-1482-0