Zobrazeno 1 - 10
of 2 867
pro vyhledávání: '"B, Robert"'
Autor:
Prathibha, T., Suneesh, A. S., Rout, Alok, Selvan, B. Robert, Suba, M. Amutha, Rao, J. S. Brahmaji, Kumar, G. V. S. Ashok, Bola Sankar, D., Rajeswari, S., Ramanathan, N., Suresh, A., Jayaraman, V., Sivaraman, N.
Publikováno v:
In Journal of Nuclear Materials November 2024 600
Autor:
Elliott, Lindsay C. C., Pintar, Adam L., Copeland, Craig R., Renegar, Thomas B., Dixson, Ronald G., Ilic, B. Robert, Verkouteren, R. Michael, Stavis, Samuel M.
Publikováno v:
Analytical Chemistry, 94, 2, 678-686 (2022)
Gravimetry typically lacks the resolution to measure single microdroplets, whereas microscopy is often inaccurate beyond the resolution limit. To address these issues, we advance and integrate these complementary methods, introducing simultaneous mea
Externí odkaz:
http://arxiv.org/abs/2109.09455
Autor:
Copeland, Craig R., Pintar, Adam L., Dixson, Ronald G., Chanana, Ashish, Srinivasan, Kartik, Westly, Daron A., Ilic, B. Robert, Davanco, Marcelo I., Stavis, Samuel M.
Traceability to the International System of Units (SI) is fundamental to measurement accuracy and reliability. In this study, we demonstrate subnanometer traceability of localization microscopy, establishing a metrological foundation for the maturati
Externí odkaz:
http://arxiv.org/abs/2106.10221
Autor:
Liao, Kuo-Tang, Madison, Andrew C., Pintar, Adam L., Ilic, B. Robert, Copeland, Craig R., Stavis, Samuel M.
Plastic nanoparticles present technological opportunities and environmental concerns, but measurement challenges impede product development and hazard assessment. To meet these challenges, we advance a lateral nanoflow assay that integrates complex n
Externí odkaz:
http://arxiv.org/abs/2101.03881
Autor:
Madison, Andrew C., Villarrubia, John S., Liao, Kuo-Tang, Copeland, Craig R., Schumacher, Joshua, Siebein, Kerry, Ilic, B. Robert, Liddle, J. Alexander, Stavis, Samuel M.
Focused-ion-beam machining is a powerful process to fabricate complex nanostructures, often through a sacrificial mask that enables milling beyond the resolution limit of the ion beam. However, current understanding of this super-resolution effect is
Externí odkaz:
http://arxiv.org/abs/2012.01678
Publikováno v:
In Colloids and Surfaces A: Physicochemical and Engineering Aspects 20 February 2024 683
Autor:
Na'ima B. Robert
A personal story of the author reflecting on her journey of life with references to quotes from the Qur'an, Hadith and contemporary thinkers.
Autor:
Selvan, B. Robert1 (AUTHOR), Sriram, S.1 (AUTHOR), Chand, Manish1 (AUTHOR), Suba, M. Amutha1 (AUTHOR), Suneesh, A. S.1 (AUTHOR) suneesh@igcar.gov.in, Murthy, A. Sree Rama1,2 (AUTHOR), Balakrishnan, S.1 (AUTHOR), Ramanathan, N.1,2 (AUTHOR) nram@igcar.gov.in, Vijayalakshmi, S.1 (AUTHOR), Jayaraman, V.1,2 (AUTHOR)
Publikováno v:
Journal of Radioanalytical & Nuclear Chemistry. Mar2024, Vol. 333 Issue 3, p1419-1426. 8p.
Publikováno v:
Nature Communications, 12, 3925 (2021)
A standard paradigm of localization microscopy involves extension from two to three dimensions by engineering information into emitter images, and approximation of errors resulting from the field dependence of optical aberrations. We invert this stan
Externí odkaz:
http://arxiv.org/abs/2009.01170