Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Aydan Uyar"'
Autor:
M. Selim Ünlü, T. Berkin Cilingiroglu, Aydan Uyar, Ahmet Tuysuzoglu, Bennett B. Goldberg, Janusz Konrad, W. Clem Karl
Publikováno v:
Optics express. 23(11)
Resolution improvement through signal processing techniques for integrated circuit imaging is becoming more crucial as the rapid decrease in integrated circuit dimensions continues. Although there is a significant effort to push the limits of optical
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7d4b33536add521d90f87a9446c1409a
https://pubmed.ncbi.nlm.nih.gov/26072864
https://pubmed.ncbi.nlm.nih.gov/26072864
Autor:
Bennett B. Goldberg, Mahmoud Zangeneh, Ajay Joshi, Aydan Uyar, Boyou Zhou, Ronen Adato, Selim Unlu, Tianyu Yang
Publikováno v:
DAC
Hardware Trojans are a critical security threat to integrated circuits. We propose an optical method to detect and localize Trojans inserted during the chip fabrication stage. We engineer the fill cells in a standard cell library to be highly reflect
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0533e0beeb046c332d67a03805df9875
https://doi.org/10.1145/2744769.2744822
https://doi.org/10.1145/2744769.2744822
Autor:
T. Berkin Cilingiroglu, Mahmoud Zangeneh, Aydan Uyar, W. Clem Karl, Janusz Konrad, Ajay Joshi, Bennett B. Goldberg, M. Selim Unlu
Publikováno v:
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::955518bf8b9b77521f8e5e2e9ebb7bf7
https://doi.org/10.7873/date.2015.0269
https://doi.org/10.7873/date.2015.0269
Autor:
Ajay Joshi, Aydan Uyar, M. Selim Ünlü, Mahmoud Zangeneh, Boyou Zhou, Bennett B. Goldberg, Ronen Adato
Publikováno v:
Frontiers in Optics 2015.
We demonstrate a multi-spectral imaging technique that utilizes integrated nanoantenna labels to enable rapid mapping of the type and location of every logical gate in an integrated circuit, and thereby detect hardware tampering.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3d25f8251afcd34365228b2f86396689
https://doi.org/10.1364/fio.2015.fth1b.2
https://doi.org/10.1364/fio.2015.fth1b.2
Publikováno v:
International Symposium for Testing and Failure Analysis.
The demand for high resolution has raised interest for the use of aplanatic solid immersion lenses (aSIL) for backside optical inspection and failure analysis of integrated circuits due to its high numerical aperture capability. This work investigate
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f7aeb06a89589424cfbb99e50d5e788b
https://doi.org/10.31399/asm.cp.istfa2014p0293
https://doi.org/10.31399/asm.cp.istfa2014p0293
Publikováno v:
Frontiers in Optics 2014.
Forbidden light, the cone of high-angle light formed above critical angle, plays a critical role in near-interface high numerical aperture imaging. We investigate its effect in subsurface imaging in aplanatic solid immersion microscopy on ICs.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::62bd3888377caeda9957f548640600c3
https://doi.org/10.1364/fio.2014.ftu1g.2
https://doi.org/10.1364/fio.2014.ftu1g.2
Publikováno v:
Optics Express. 22:7422
The collection of light at very high numerical aperture allows detection of evanescent waves above the critical angle of total internal reflection in solid immersion lens microscopy. We investigate the effect of such evanescent modes, so-called forbi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::aad2f667355770a8762f71e55813d6a6
https://doi.org/10.1364/oe.22.007422
https://doi.org/10.1364/oe.22.007422