Zobrazeno 1 - 10
of 21
pro vyhledávání: '"Ayadi, Khaled"'
Autor:
León Pérez, Edgar A.A., Guenery, Pierre-Vincent, Abouzaid, Oumaïma, Ayadi, Khaled, Brottet, Solène, Moeyaert, Jérémy, Labau, Sébastien, Baron, Thierry, Blanchard, Nicholas, Baboux, Nicolas, Militaru, Liviu, Souifi, Abdelkader
Publikováno v:
In Solid State Electronics May 2018 143:20-26
Akademický článek
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K zobrazení výsledku je třeba se přihlásit.
Autor:
Barbos, Corina, Blanc-Pelissier, Danièle, Fave, Alain, Blanquet, Elisabeth, Crisci, Alexandre, Fourmond, Erwann, Albertini, David, Sabac, Andreï, Ayadi, Khaled, Girard, Philippe, Lemiti, Mustapha
Publikováno v:
In Energy Procedia August 2015 77:558-564
Autor:
Bernard, Samuel *, Ayadi, Khaled, Berthet, Marie-Paule, Chassagneux, Fernand, Cornu, David, Letoffe, Jean-Marie, Miele, Philippe *
Publikováno v:
In Journal of Solid State Chemistry 2004 177(6):1803-1810
Autor:
Leon Perez, Edgar, GUENERY, Pierre-Vincent, ABOUZAID, O., Ayadi, Khaled, BROTTET, Solène, Moeyaert, J., Labau, S., Baron, T., Blanchard, Nicholas, BABOUX, Nicolas, militaru, Liviu, SOUIFI, Abdelkader
Publikováno v:
Solid-State Electronics
Solid-State Electronics, Elsevier, 2017
Solid-State Electronics, Elsevier, 2017
International audience; no abstract
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::4c446bc2b0b1f8077748ffdab60a9e3c
https://hal.archives-ouvertes.fr/hal-01701531
https://hal.archives-ouvertes.fr/hal-01701531
Autor:
Guillaume, Nicolas, Puyoo, Etienne, Le Berre, M., Albertini, David, BABOUX, Nicolas, Chevalier, Céline, Gautier, Brice, CALMON, Francis, GREGOIRE, Joëlle, Ayadi, Khaled
Publikováno v:
On the behavior of electrically stressed Ti/TiOx/Ti junctions fabricated by local anodic oxidation
On the behavior of electrically stressed Ti/TiOx/Ti junctions fabricated by local anodic oxidation, 2015, Lille, France. 2015
On the behavior of electrically stressed Ti/TiOx/Ti junctions fabricated by local anodic oxidation, 2015, Lille, France. 2015
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::08e4b1f1cef7705460d1086f6929320e
https://hal.archives-ouvertes.fr/hal-01489627
https://hal.archives-ouvertes.fr/hal-01489627
Capacitive coupling is most commonly used in NEMS/MEMS or in Scanning Probe Techniques to either induce a displacement or to detect an external interaction applied to the micro/nanosystem. A parabolic elastic deformation of the sensor signs a capacit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::4a71c8f502b282ea8a24012fb8cbb1b5
https://hal.archives-ouvertes.fr/hal-00088810/file/Non_parabolic_capacitive_very_last-1.pdf
https://hal.archives-ouvertes.fr/hal-00088810/file/Non_parabolic_capacitive_very_last-1.pdf
Autor:
Miele, Philippe, Toury, Bérangère, Bernard, Samuel, Cornu, David, Ayadi, Khaled, Rousseau, Loic, Beauhaire, Guy
Publikováno v:
France, Patent n° : EP1329436. 2003
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::1fd2729c40746e6c20a523b76059d1a0
https://hal-cnrs.archives-ouvertes.fr/hal-02866813
https://hal-cnrs.archives-ouvertes.fr/hal-02866813