Zobrazeno 1 - 3
of 3
pro vyhledávání: '"August Ning"'
Autor:
Fei Gao, Ting-Jung Chang, Ang Li, Marcelo Orenes-Vera, Davide Giri, Paul J. Jackson, August Ning, Georgios Tziantzioulis, Joseph Zuckerman, Jinzheng Tu, Kaifeng Xu, Grigory Chirkov, Gabriele Tombesi, Jonathan Balkind, Margaret Martonosi, Luca Carloni, David Wentzlaff
Publikováno v:
2023 IEEE Custom Integrated Circuits Conference (CICC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6e7aac6cb51e4108c8903ff19ae9be59
https://doi.org/10.1109/cicc57935.2023.10121257
https://doi.org/10.1109/cicc57935.2023.10121257
Autor:
Ting-Jung Chang, Ang Li, Fei Gao, Tuan Ta, Georgios Tziantzioulis, Yanghui Ou, Moyang Wang, Jinzheng Tu, Kaifeng Xu, Paul J. Jackson, August Ning, Grigory Chirkov, Marcelo Orenes-Vera, Shady Agwa, Xiaoyu Yan, Eric Tang, Jonathan Balkind, Christopher Batten, David Wentzlaff
Publikováno v:
2023 IEEE Custom Integrated Circuits Conference (CICC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4cf8fba233f80bb070aa57761388e6a7
https://doi.org/10.1109/cicc57935.2023.10121294
https://doi.org/10.1109/cicc57935.2023.10121294
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 29:409-422
Sensitivity to process variations and manufacturing defects are major showstoppers for the high-volume manufacturing of carbon nanotube field-effect transistors (CNFETs). These imperfections affect gate delay and may remain undetected when test patte
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::34ae40f0f60b61e0f6b6e1dbf76e865a
https://doi.org/10.1109/tvlsi.2020.3045417
https://doi.org/10.1109/tvlsi.2020.3045417