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pro vyhledávání: '"Auger-mediated trapping"'
Autor:
Boehme, Simon C., Mikel Azpiroz, Jon, Aulin, Yaroslav V., Grozema, Ferdinand C., Vanmaekelbergh, Daniel, Siebbeles, Laurens D. A., Infante, Ivan, Houtepen, Arjan J., Sub Condensed Matter and Interfaces, Condensed Matter and Interfaces
Publikováno v:
Boehme, S C, Azpiroz, J M, Aulin, Y V, Grozema, F C, Vanmaekelbergh, D, Siebbeles, L D A, Infante, I & Houtepen, A J 2015, ' Density of trap states and Auger-mediated electron trapping in CdTe quantum-dot solids ', Nano Letters, pp. 3056-3066 . https://doi.org/10.1021/acs.nanolett.5b00050
Nano Letters, 15(5), 3056. American Chemical Society
Nano Letters, 3056-3066. American Chemical Society
STARTPAGE=3056;ENDPAGE=3066;ISSN=1530-6984;TITLE=Nano Letters
Nano Letters, 15(5), 3056. American Chemical Society
Nano Letters, 3056-3066. American Chemical Society
STARTPAGE=3056;ENDPAGE=3066;ISSN=1530-6984;TITLE=Nano Letters
Charge trapping is an ubiquitous process in colloidal quantum-dot solids and a major limitation to the efficiency of quantum dot based devices such as solar cells, LEDs, and thermoelectrics. Although empirical approaches led to a reduction of trappin