Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Audrey Surmin"'
Autor:
Fabien Pilon, Audrey Surmin, Hervé Piombini, Christophe Dujardin, X. Le Borgne, Matthieu Pommiès, Bertrand Bertussi, Jean-Claude Birolleau, David Damiani
Publikováno v:
Optics Communications. 275:372-378
In this paper we examine how optical techniques can be used for impurities (or defects) detection and identification in KH 2 PO 4 (KDP) components. This is important in so far as some of these defects are responsible for a much weaker than expected L
Publikováno v:
HAL
Acta Crystallographica Section B: Structural Science
Acta Crystallographica Section B: Structural Science, International Union of Crystallography, 2006, pp.228-235
Acta Crystallographica Section B: Structural Science
Acta Crystallographica Section B: Structural Science, International Union of Crystallography, 2006, pp.228-235
The structures of two specimens of the (K1 − y Na y )2F − 2(Sr x Ba1 − x )2 − F Nb2O6 family (KNSBN) have been solved and refined (x I = 0.6, y I = 0.45, F I = 1.07 and x II = 0.72, y II = 0.45, F II = 1.08). The KNSBN compounds appear to be
Autor:
Laurent Lamaignère, Bertrand Bertussi, C. Maunier, Karine Valle, Audrey Surmin, François Guillet, David Damiani
Publikováno v:
Laser-Induced Damage in Optical Materials: 2008.
In order to characterize the effect of thermal annealing on laser damage resistance of KDP, several combinations of laser conditioning and thermal annealing were applied to two SHG KDP samples. One sample was tested at 3ω, 16ns and the other one at
Publikováno v:
SPIE Proceedings.
In this paper, the nature of the crystalline phases observed at the surface damage sites resulting from laser irradiation is investigated by X-ray diffraction. The results are compared against new data on thermal decomposition of KDP salt. The damage
Autor:
Fabien Pilon, Bertrand Bertussi, Jean-Claude Birolleau, Matthieu Pommiès, Audrey Surmin, David Damiani, Christophe Dujardin, Xavier Le Borgne, Hervé Piombini
Publikováno v:
SPIE Proceedings.
In this paper we examine how optical techniques can be used for impurities and defects detection in KH 2 PO 4 (KDP) components. This is important in so far as some of these defects are responsible for a weaker than expected laser-induced threshold in
Autor:
Jean-Claude Birolleau, B. Bertussi, F. Guillet, Audrey Surmin, Fabien Pilon, S. Lambert, X. Leborgne, Matthieu Pommiès, D. Damiani, H. Piombini
Publikováno v:
SPIE Proceedings.
This study is concerned with the identification of the defects responsible for laser damage observed on KDP/DKDP frequency triplers used in high power lasers. We reported at BDS 2005 a non destructive high energy X-ray topographic setup able to chara
Publikováno v:
SPIE Proceedings.
X-ray diffraction is a non destructive technique used in order to characterize defects in the single crystal. Unfortunately, this analysis can not be performed throughout the whole volume on thick KH 2 PO 4 (KDP) crystals used in the high power laser