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Autor:
Audrey C, Parker, Olivia O, Maryon, Mojtaba T, Kaffash, M Benjamin, Jungfleisch, Paul H, Davis
Publikováno v:
Journal of Visualized Experiments.
Magnetic force microscopy (MFM) enables mapping local magnetic fields across a sample surface with nanoscale resolution. To perform MFM, an atomic force microscopy (AFM) probe whose tip has been magnetized vertically (i.e., perpendicular to the probe