Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Atul Chabbra"'
Autor:
Bharath Nandakumar, Robert C. Redburn, Nicholai L' Esperance, Sameer Chillarige, Atul Chabbra, Anil K. Malik
Publikováno v:
ITC
The main goal of existing scan chain diagnosis approaches is to identify a point (or range of points) in the scan chain(s) at which values are directly corrupted due to a defect. A common assumption made in these techniques is the defect causing fail
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3956ba68cb77dcc2d9a8eb00f9d7ea4d
https://doi.org/10.1109/itc44778.2020.9325236
https://doi.org/10.1109/itc44778.2020.9325236
Autor:
Atul Chabbra, Anil K. Malik, Jeff Zimmerman, Robert C. Redburn, Nicholai L' Esperance, Adisun Wheelock, Sameer Chillarige, Bharath Nandakumar, Martin Amodeo
Publikováno v:
2020 IEEE International Test Conference India.
Numerous areas of VLSI Design and Automation including test and diagnosis have already started benefiting from machine learning based approaches. In this paper, we focus on application of machine learning techniques in the context of Volume Diagnosis
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::01a197fb799582045b7b8c27f5dc8fb1
https://doi.org/10.1109/itcindia49857.2020.9171800
https://doi.org/10.1109/itcindia49857.2020.9171800