Zobrazeno 1 - 10
of 36
pro vyhledávání: '"Atsushi Kawasumi"'
Autor:
Atsushi Kawasumi, Y. Yamamoto, Shinji Miyano, S. Moriwaki, Toshikazu Suzuki, Hirofumi Shinohara, Takeshi Sakurai
Publikováno v:
IEEE Journal of Solid-State Circuits. 48:924-931
Low voltage SRAM at a near-threshold voltage has two major sources of power waste: excess bit line swing due to the random variation of transistors and dynamic power consumption of the bit line swing of non-selected columns. In order to overcome thes
Autor:
Hugh Mair, Atsushi Kawasumi
Publikováno v:
ISSCC
Advanced SRAM continues to be one of the critical technology enablers for a wide range of applications - from mobile to high performance servers to the Internet of Everything. Combining the process technologies of FinFET and FD-SOI with advanced circ
Autor:
Takashi Nakada, Atsushi Kawasumi, Shinobu Fujita, Hiroyuki Hara, Keiko Abe, Junichi Ito, Naoharu Shimomura, Satoshi Takaya, Eishi Arima, Kazutaka Ikegami, Keiichi Kushida, Hiroki Noguchi, Hiroshi Nakamura
Publikováno v:
ISSCC
Two performance gaps in the memory hierarchy, between CPU cache and main memory, and main memory and mass storage, will become increasingly severe bottlenecks for computing-system performance. Although it is necessary to increase memory capacity to f
Autor:
Yuki Fujimura, Keiichi Kushida, Y. Takeyama, Fumihiko Tachibana, Tomoaki Yabe, Osamu Hirabayashi, A. Suzuki, Atsushi Kawasumi, Yusuke Niki
Publikováno v:
IEEE Journal of Solid-State Circuits. 46:2545-2551
A digitized replica bitline delay technique has been proposed for random-variation-tolerant timing generation of static random access memory (SRAM) sense amplifiers (SA). The timing variation of SA attributable to the random variation of transistor t
Publikováno v:
Journal of the City Planning Institute of Japan. 46:157-162
Publikováno v:
Journal of the City Planning Institute of Japan. 46:901-906
Autor:
Y. Takeyama, G. Fukano, Osamu Hirabayashi, Tomoaki Yabe, Atsushi Kawasumi, Yuki Fujimura, Akira Katayama, Tadahiro Sasaki, Keiichi Kushida, A. Suzuki
Publikováno v:
IEEE Journal of Solid-State Circuits. 44:1192-1198
We proposed a novel SRAM architecture with a high-density cell in low-supply-voltage operation. A self-write-back sense amplifier realizes cell failure rate improvement by more than two orders of magnitude at 0.6 V. A cascaded bit line scheme saves a
Publikováno v:
Extended Abstracts of the 2015 International Conference on Solid State Devices and Materials.
Autor:
Hiroyuki Hara, Keiichi Kushida, Shinobu Fujita, Junichi Ito, Naoharu Shimomura, Shogo Itai, Satoshi Takaya, Hiroki Noguchi, Kazutaka Ikegami, Keiko Abe, Atsushi Kawasumi
Publikováno v:
ISSCC
Nonvolatile memory, spin-transfer torque magnetoresistive RAM (STT-MRAM) is being developed to realize nonvolatile working memory because it provides high-speed accesses, high endurance, and CMOS-logic compatibility. Furthermore, programming current
Autor:
Keiichi Kushida, T. Ochiai, Hiroki Noguchi, Eiji Kitagawa, Ito Junichi, Naoharu Shimomura, Hiroyuki Hara, Chikayoshi Kamata, S. Fujita, Shogo Itai, Atsushi Kawasumi, Keiko Abe, Daisuke Saida, Kazutaka Ikegami, Minoru Amano, Chika Tanaka
Publikováno v:
2014 IEEE International Electron Devices Meeting.
Since it has been difficult to increase clock frequency of processors due to power budget, there is a trend toward increase in number of processor cores and cache capacities (Fig. 1) to improve the processor performance. According to this trend, ther