Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Athanasios Dimakos"'
Autor:
Alexandre Siligaris, Salvador Mir, Haralampos-G. Stratigopoulos, Athanasios Dimakos, Emeric De Foucauld
Publikováno v:
Design, Automation & Test in Europe Conference
Design, Automation & Test in Europe Conference, Mar 2016, Dresden, Germany
DATE
Design, Automation & Test in Europe Conference, Mar 2016, Dresden, Germany
DATE
This paper addresses the high-volume production test problem for millimeter-wave (mm-Wave) circuits. Bit error rate testing is the only feasible solution nowadays for mm-Wave transceivers, but is extremely costly and challenging to be implemented in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f54ad0c0c8b7e19aafe1c5a47002264d
https://hal.sorbonne-universite.fr/hal-01359620
https://hal.sorbonne-universite.fr/hal-01359620
Autor:
Emeric De Foucauld, Alexandre Siligaris, Haralampos-G. Stratigopoulos, Athanasios Dimakos, Salvador Mir
Publikováno v:
Journal of Electronic Testing
Journal of Electronic Testing, Springer Verlag, 2015, 31 (4), pp.381-394. ⟨10.1007/s10836-015-5534-4⟩
Journal of Electronic Testing: : Theory and Applications
Journal of Electronic Testing: : Theory and Applications, 2015, 31 (4), pp.381-394. ⟨10.1007/s10836-015-5534-4⟩
Journal of Electronic Testing, Springer Verlag, 2015, 31 (4), pp.381-394. ⟨10.1007/s10836-015-5534-4⟩
Journal of Electronic Testing: : Theory and Applications
Journal of Electronic Testing: : Theory and Applications, 2015, 31 (4), pp.381-394. ⟨10.1007/s10836-015-5534-4⟩
International audience; Testing the RF functions of systems-on-chip incurs a very high cost. Built-in test is a promising alternative to facilitate testing and reduce cost. However, designing built-in test circuits that tap into the sensitive RF sign
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::238dc6fc4538af07c39b650d9f6cf533
https://hal.sorbonne-universite.fr/hal-01224425
https://hal.sorbonne-universite.fr/hal-01224425
Autor:
Haralampos-S. Stratigopoulos, Martin Andraud, Emmanuel Simeu, Athanasios Dimakos, Salvador Mir, Louay Abdallah
Publikováno v:
ISVLSI
IEEE International Computer Society Annual Symposium on VLSI (ISVLSI'15)
IEEE International Computer Society Annual Symposium on VLSI (ISVLSI'15), Jul 2015, Montpellier, France. pp.627
IEEE International Computer Society Annual Symposium on VLSI (ISVLSI'15)
IEEE International Computer Society Annual Symposium on VLSI (ISVLSI'15), Jul 2015, Montpellier, France. pp.627
Testing the RF functions of mixed-signal Systems-on-Chip is responsible for a very large fraction of the overall test cost. In addition, RF circuits, when designed in the most advanced technologies (e.g. 65nm and beyond), typically require some calib
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4dbd90bbe23b2cd0f16cb562444ae098
https://doi.org/10.1109/isvlsi.2015.42
https://doi.org/10.1109/isvlsi.2015.42
Autor:
Emeric De Foucauld, Alexandre Siligaris, Athanasios Dimakos, Salvador Mir, Haralampos-G. Stratigopoulos
Publikováno v:
IEEE International Mixed-signals, Sensors and Systems Test Workshop (IMS3TW'14)
IEEE International Mixed-signals, Sensors and Systems Test Workshop (IMS3TW'14), Sep 2014, Porto Alegre, Brazil. pp.1-6, ⟨10.1109/IMS3TW.2014.6997397⟩
IEEE International Mixed-signals, Sensors and Systems Test Workshop (IMS3TW'14), Sep 2014, Porto Alegre, Brazil. pp.1-6, ⟨10.1109/IMS3TW.2014.6997397⟩
International audience; In this paper, we discuss the use of non-intrusive sensors to enable a built-in test for a 65nm RF LNA. The non-intrusive sensors consist of single layout components copied from the topology of the LNA and dummy analog stages
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::df4025245b36fd4b2925f0c5ebee3d5b
https://hal.science/hal-01118101
https://hal.science/hal-01118101