Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Aswin N. Mehta"'
Autor:
Stephen Heinrich-Barna, Aswin N. Mehta
Publikováno v:
2014 IEEE 6th International Memory Workshop (IMW).
We present a simulation methodology to analyze single bit fails in SRAMs with no visual defect to account for the failure. Our approach generates the MOS IV curves for all six transistors of the failing bit cell and uses this data to simulate read, w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::061cbf601b967033f1d4c2e323dfeee3
https://doi.org/10.1109/imw.2014.6849393
https://doi.org/10.1109/imw.2014.6849393
Autor:
Charles P. Todd, Aswin N. Mehta, Omar Diaz de Leon, Daniel Gobled, Kendall S. Wills, James Grund, Rand B. Carawan, Sundari Nagarathnam, Willmar E. Subido, Kartik Ramanujachar, Siva Kolachina, Tim Nagel, Christine Charpentier
Publikováno v:
ISTFA 2001: Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis.
Optical waveform probing is a critical component in flipchip diagnostics. There is a dramatic increase in the need for backside silicon probing of non-flipchip packaged devices. The effective way to implement this strategy is to package the die in a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::35e6c473488776a7a1167044f3841ae8
https://doi.org/10.31399/asm.cp.istfa2001p0051
https://doi.org/10.31399/asm.cp.istfa2001p0051
Autor:
Aswin N. Mehta, Kenneth E. Krause, Brad E. Campbell, John M. Carulli, Fred A. Valente, Derek C. Wrobbel
Publikováno v:
SPIE Proceedings.
It is critical for success in the microprocessor business to understand the relationship between yield and speed- performance. This paper outlines a method for modeling device speed distribution and yield using on-chip ring-oscillator measurements. T
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7eab9c34d677ba9bec21eb0b5b3e42ff
https://doi.org/10.1117/12.361341
https://doi.org/10.1117/12.361341
Autor:
Aswin N. Mehta, Greg Billus
Publikováno v:
SPIE Proceedings.
We have developed a set of analysis tools to accelerate root-cause understanding of any UltraSPARCTMI processor manufacturing process or design problems encountered on the path to volume manufacturing ramp. Wealso use these tools to understand root-c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::55594ab89ec5682f7540b819b4e006b3
https://doi.org/10.1117/12.250839
https://doi.org/10.1117/12.250839