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pro vyhledávání: '"Asokan, Muthappan"'
Autor:
Asokan, Muthappan
With the reliability requirements of automobile microelectronics pushing towards near 0 ppb levels of failure control, halide induced corrosion issues in wire bonded devices have to be tightly controlled to achieve such a high reliability goal. With
Externí odkaz:
https://digital.library.unt.edu/ark:/67531/metadc1703372/
Autor:
Ross, Nick, Asokan, Muthappan, Ashok Kumar, Goutham Issac, Caperton, Joshua, Alptekin, John, Salunke, Ashish Shivaji, Chyan, Oliver M.
Publikováno v:
In Microelectronics Reliability October 2020 113
Autor:
Yu, Kyle Kai-Hung, Rimal, Sirish, Asokan, Muthappan, Nalla, Praveen R., Koskey, Simon, Pillai, Karthikeyan S.M., Chyan, Oliver, Singh, Kanwal Jit, Suri, Satyarth
Publikováno v:
In Electrochimica Acta 20 August 2016 210:512-519
Publikováno v:
In Journal of Industrial and Engineering Chemistry 25 July 2017 51:44-48