Zobrazeno 1 - 10
of 292
pro vyhledávání: '"Askerka, M."'
Autor:
Flesher DA; Department of Molecular Biophysics and Biochemistry, Yale University, New Haven, CT, 06520, USA., Liu J; Department of Molecular Biophysics and Biochemistry, Yale University, New Haven, CT, 06520, USA., Wiwczar JM; Department of Molecular Biophysics and Biochemistry, Yale University, New Haven, CT, 06520, USA., Reiss K; Department of Chemistry, Yale University, New Haven, CT, 05620, USA., Yang KR; Department of Chemistry, Yale University, New Haven, CT, 05620, USA., Wang J; Department of Molecular Biophysics and Biochemistry, Yale University, New Haven, CT, 06520, USA., Askerka M; Department of Chemistry, Yale University, New Haven, CT, 05620, USA., Gisriel CJ; Department of Chemistry, Yale University, New Haven, CT, 05620, USA., Batista VS; Department of Chemistry, Yale University, New Haven, CT, 05620, USA., Brudvig GW; Department of Molecular Biophysics and Biochemistry, Yale University, New Haven, CT, 06520, USA. gary.brudvig@yale.edu.; Department of Chemistry, Yale University, New Haven, CT, 05620, USA. gary.brudvig@yale.edu.
Publikováno v:
Photosynthesis research [Photosynth Res] 2022 May; Vol. 152 (2), pp. 167-175. Date of Electronic Publication: 2022 Mar 23.
Publikováno v:
In Methods in Enzymology 2016 577:443-481
Autor:
Zhong M; Department of Electrical and Computer Engineering, University of Toronto, Toronto, Ontario, Canada.; College of Engineering and Applied Sciences, National Laboratory of Solid State Microstructures, Collaborative Innovation Center of Advanced Microstructure, Nanjing University, Nanjing, China., Tran K; Chemical Engineering, Carnegie Mellon University, Pittsburgh, PA, USA., Min Y; Department of Electrical and Computer Engineering, University of Toronto, Toronto, Ontario, Canada., Wang C; Department of Electrical and Computer Engineering, University of Toronto, Toronto, Ontario, Canada., Wang Z; Department of Electrical and Computer Engineering, University of Toronto, Toronto, Ontario, Canada., Dinh CT; Department of Electrical and Computer Engineering, University of Toronto, Toronto, Ontario, Canada., De Luna P; Materials Science Engineering, University of Toronto, Toronto, Ontario, Canada.; National Research Council of Canada, Ottawa, Ontario, Canada., Yu Z; Chemical Engineering, Carnegie Mellon University, Pittsburgh, PA, USA., Rasouli AS; Department of Electrical and Computer Engineering, University of Toronto, Toronto, Ontario, Canada., Brodersen P; Ontario Centre for Characterization of Advanced Materials (OCCAM), University of Toronto, Toronto, Ontario, Canada., Sun S; National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, China., Voznyy O; Department of Electrical and Computer Engineering, University of Toronto, Toronto, Ontario, Canada., Tan CS; Department of Electrical and Computer Engineering, University of Toronto, Toronto, Ontario, Canada., Askerka M; Department of Electrical and Computer Engineering, University of Toronto, Toronto, Ontario, Canada., Che F; Department of Electrical and Computer Engineering, University of Toronto, Toronto, Ontario, Canada., Liu M; Department of Electrical and Computer Engineering, University of Toronto, Toronto, Ontario, Canada., Seifitokaldani A; Department of Electrical and Computer Engineering, University of Toronto, Toronto, Ontario, Canada., Pang Y; Department of Electrical and Computer Engineering, University of Toronto, Toronto, Ontario, Canada., Lo SC; Industrial Technology Research Institute, Material and Chemical Research Laboratories, Hsinchu, Taiwan., Ip A; Department of Electrical and Computer Engineering, University of Toronto, Toronto, Ontario, Canada., Ulissi Z; Chemical Engineering, Carnegie Mellon University, Pittsburgh, PA, USA. zulissi@andrew.cmu.edu., Sargent EH; Department of Electrical and Computer Engineering, University of Toronto, Toronto, Ontario, Canada. ted.sargent@utoronto.ca.
Publikováno v:
Nature [Nature] 2020 May; Vol. 581 (7807), pp. 178-183. Date of Electronic Publication: 2020 May 13.
Autor:
Voznyy O; Department of Electrical and Computer Engineering , University of Toronto , Toronto , M5S 3G4 , Canada., Levina L; Department of Electrical and Computer Engineering , University of Toronto , Toronto , M5S 3G4 , Canada., Fan JZ; Department of Electrical and Computer Engineering , University of Toronto , Toronto , M5S 3G4 , Canada., Askerka M; Department of Electrical and Computer Engineering , University of Toronto , Toronto , M5S 3G4 , Canada., Jain A; Department of Electrical and Computer Engineering , University of Toronto , Toronto , M5S 3G4 , Canada., Choi MJ; Department of Electrical and Computer Engineering , University of Toronto , Toronto , M5S 3G4 , Canada., Ouellette O; Department of Electrical and Computer Engineering , University of Toronto , Toronto , M5S 3G4 , Canada., Todorović P; Department of Electrical and Computer Engineering , University of Toronto , Toronto , M5S 3G4 , Canada., Sagar LK; Department of Electrical and Computer Engineering , University of Toronto , Toronto , M5S 3G4 , Canada., Sargent EH; Department of Electrical and Computer Engineering , University of Toronto , Toronto , M5S 3G4 , Canada.
Publikováno v:
ACS nano [ACS Nano] 2019 Oct 22; Vol. 13 (10), pp. 11122-11128. Date of Electronic Publication: 2019 Sep 24.
Autor:
Kaur D; Department of Chemistry, The Graduate Center of the City University of New York, New York, NY, 10016, USA.; Department of Physics, City College of New York, 160 Convent Avenue, New York, NY, 10031, USA., Szejgis W; Department of Physics, City College of New York, 160 Convent Avenue, New York, NY, 10031, USA., Mao J; Department of Physics, City College of New York, 160 Convent Avenue, New York, NY, 10031, USA., Amin M; University of Groningen, Nijenborgh 4, 9747 AG, Groningen, The Netherlands., Reiss KM; Department of Chemistry, Yale University, New Haven, CT, 06520, USA., Askerka M; Department of Chemistry, Yale University, New Haven, CT, 06520, USA., Cai X; Department of Physics, City College of New York, 160 Convent Avenue, New York, NY, 10031, USA.; Department of Physics, The Graduate Center of the City University of New York, New York, NY, 10016, USA., Khaniya U; Department of Physics, City College of New York, 160 Convent Avenue, New York, NY, 10031, USA.; Department of Physics, The Graduate Center of the City University of New York, New York, NY, 10016, USA., Zhang Y; Department of Physics, City College of New York, 160 Convent Avenue, New York, NY, 10031, USA.; Department of Physics, The Graduate Center of the City University of New York, New York, NY, 10016, USA., Brudvig GW; Department of Chemistry, Yale University, New Haven, CT, 06520, USA., Batista VS; Department of Chemistry, Yale University, New Haven, CT, 06520, USA., Gunner MR; Department of Chemistry, The Graduate Center of the City University of New York, New York, NY, 10016, USA. mgunner@ccny.cuny.edu.; Department of Physics, City College of New York, 160 Convent Avenue, New York, NY, 10031, USA. mgunner@ccny.cuny.edu.; Department of Physics, The Graduate Center of the City University of New York, New York, NY, 10016, USA. mgunner@ccny.cuny.edu.
Publikováno v:
Photosynthesis research [Photosynth Res] 2019 Sep; Vol. 141 (3), pp. 331-341. Date of Electronic Publication: 2019 Apr 02.
Autor:
Askerka M; Department of Electrical and Computer Engineering , University of Toronto , 10 King's College Road , Toronto , ON , Canada M5S 3G4., Li Z; Department of Electrical and Computer Engineering , University of Toronto , 10 King's College Road , Toronto , ON , Canada M5S 3G4., Lempen M; Department of Electrical and Computer Engineering , University of Toronto , 10 King's College Road , Toronto , ON , Canada M5S 3G4., Liu Y; Department of Earth Sciences , University of Toronto , 22 Russell Street , Toronto , ON , Canada M5S 3B1., Johnston A; Department of Electrical and Computer Engineering , University of Toronto , 10 King's College Road , Toronto , ON , Canada M5S 3G4., Saidaminov MI; Department of Electrical and Computer Engineering , University of Toronto , 10 King's College Road , Toronto , ON , Canada M5S 3G4., Zajacz Z; Department of Earth Sciences , University of Toronto , 22 Russell Street , Toronto , ON , Canada M5S 3B1., Sargent EH; Department of Electrical and Computer Engineering , University of Toronto , 10 King's College Road , Toronto , ON , Canada M5S 3G4.
Publikováno v:
Journal of the American Chemical Society [J Am Chem Soc] 2019 Feb 27; Vol. 141 (8), pp. 3682-3690. Date of Electronic Publication: 2019 Feb 14.
Autor:
Li Y; Division of Nanomaterials & Chemistry, Hefei National Research Center for Physical Sciences at the Microscale, CAS Center for Excellence in Nanoscience, Hefei Science Center of CAS, Collaborative Innovation Center of Suzhou Nano Science and Technology, Department of Chemistry, University of Science and Technology of China, Hefei, 230026, China.; Anhui Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory, Chinese Academy of Sciences, Hefei, 230031, China., Zhuang TT; Division of Nanomaterials & Chemistry, Hefei National Research Center for Physical Sciences at the Microscale, CAS Center for Excellence in Nanoscience, Hefei Science Center of CAS, Collaborative Innovation Center of Suzhou Nano Science and Technology, Department of Chemistry, University of Science and Technology of China, Hefei, 230026, China.; Department of Electrical and Computer Engineering, University of Toronto, 35 St George Street, Toronto, Ontario, M5S 1A4, Canada., Fan F; CAS Key Laboratory of Microscale Magnetic Resonance and Department of Modern Physics, University of Science and Technology of China, Hefei, Anhui, 230026, China.; Synergetic Innovation Center of Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei, Anhui, 230026, China., Voznyy O; Department of Electrical and Computer Engineering, University of Toronto, 35 St George Street, Toronto, Ontario, M5S 1A4, Canada., Askerka M; Department of Electrical and Computer Engineering, University of Toronto, 35 St George Street, Toronto, Ontario, M5S 1A4, Canada., Zhu H; Department of Chemistry, Zhejiang University, Hangzhou, Zhejiang, 310027, China., Wu L; Division of Nanomaterials & Chemistry, Hefei National Research Center for Physical Sciences at the Microscale, CAS Center for Excellence in Nanoscience, Hefei Science Center of CAS, Collaborative Innovation Center of Suzhou Nano Science and Technology, Department of Chemistry, University of Science and Technology of China, Hefei, 230026, China., Liu GQ; Division of Nanomaterials & Chemistry, Hefei National Research Center for Physical Sciences at the Microscale, CAS Center for Excellence in Nanoscience, Hefei Science Center of CAS, Collaborative Innovation Center of Suzhou Nano Science and Technology, Department of Chemistry, University of Science and Technology of China, Hefei, 230026, China., Pan YX; School of Chemistry and Chemical Engineering, Hefei University of Technology, Hefei, Anhui, 230009, China., Sargent EH; Department of Electrical and Computer Engineering, University of Toronto, 35 St George Street, Toronto, Ontario, M5S 1A4, Canada. ted.sargent@utoronto.ca., Yu SH; Division of Nanomaterials & Chemistry, Hefei National Research Center for Physical Sciences at the Microscale, CAS Center for Excellence in Nanoscience, Hefei Science Center of CAS, Collaborative Innovation Center of Suzhou Nano Science and Technology, Department of Chemistry, University of Science and Technology of China, Hefei, 230026, China. shyu@ustc.edu.cn.; Anhui Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory, Chinese Academy of Sciences, Hefei, 230031, China. shyu@ustc.edu.cn.
Publikováno v:
Nature communications [Nat Commun] 2018 Nov 23; Vol. 9 (1), pp. 4947. Date of Electronic Publication: 2018 Nov 23.
Autor:
Xing J; Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, Singapore, 637371, Singapore.; Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto, ON, M5S 3G4, Canada.; Shaanxi Institute of Flexible Electronics (SIFE), Northwestern Polytechnical University (NPU), 127 West Youyi Road, 710072, Xi'an, Shaanxi, China., Zhao Y; Department of Materials Science and Engineering, University of Toronto, 184 College Street, Toronto, ON, M5S 3E4, Canada., Askerka M; Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto, ON, M5S 3G4, Canada., Quan LN; Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto, ON, M5S 3G4, Canada., Gong X; Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto, ON, M5S 3G4, Canada., Zhao W; Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, Singapore, 637371, Singapore., Zhao J; Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, Singapore, 637371, Singapore., Tan H; Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto, ON, M5S 3G4, Canada., Long G; Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto, ON, M5S 3G4, Canada., Gao L; Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto, ON, M5S 3G4, Canada.; Wuhan National Laboratory for Optoelectronics (WNLO) and School of Optical and Electronic Information, Huazhong University of Science and Technology (HUST), 430074, Wuhan, China., Yang Z; Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto, ON, M5S 3G4, Canada., Voznyy O; Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto, ON, M5S 3G4, Canada., Tang J; Wuhan National Laboratory for Optoelectronics (WNLO) and School of Optical and Electronic Information, Huazhong University of Science and Technology (HUST), 430074, Wuhan, China., Lu ZH; Department of Materials Science and Engineering, University of Toronto, 184 College Street, Toronto, ON, M5S 3E4, Canada. zhenghong.lu@utoronto.ca., Xiong Q; Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, Singapore, 637371, Singapore. Qihua@ntu.edu.sg.; NOVITAS, Nanoelectronics Centre of Excellence, School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore, 639798, Singapore. Qihua@ntu.edu.sg.; MajuLab, CNRS-UNS-NUS-NTU International Joint Research Unit, UMI-3654, Singapore, 639798, Singapore. Qihua@ntu.edu.sg., Sargent EH; Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto, ON, M5S 3G4, Canada. ted.sargent@utoronto.ca.
Publikováno v:
Nature communications [Nat Commun] 2018 Aug 30; Vol. 9 (1), pp. 3541. Date of Electronic Publication: 2018 Aug 30.
Autor:
Liu, Qi1 (AUTHOR) liuq@whut.edu.cn, Li, Hang1 (AUTHOR), Wang, Xiaoqian1 (AUTHOR), He, Jiazhen1 (AUTHOR), Luo, Xuemin1 (AUTHOR), Wang, Mingwei1 (AUTHOR), Liu, Jinfeng1 (AUTHOR), Liu, Yong1 (AUTHOR) liuyong3873@whut.edu.cn
Publikováno v:
Materials (1996-1944). Jun2024, Vol. 17 Issue 11, p2563. 12p.
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.