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pro vyhledávání: '"Ashton E, Enrriques"'
Autor:
Ashton E, Enrriques, Sean, Howard, Raju, Timsina, Nawal K, Khadka, Amber N, Hoover, Allison E, Ray, Ling, Ding, Chioma, Onwumelu, Stephan, Nordeng, Laxman, Mainali, Gunes, Uzer, Paul H, Davis
Publikováno v:
Journal of Visualized Experiments.
An atomic force microscope (AFM) fundamentally measures the interaction between a nanoscale AFM probe tip and the sample surface. If the force applied by the probe tip and its contact area with the sample can be quantified, it is possible to determin