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pro vyhledávání: '"Ashot Oganesyan"'
Autor:
Stan J. Friesenhahn, Boris Apotovsky, Jack F. Butler, Ashot Oganesyan, Bo Pi, F. Patrick Doty, S. Zhao, Richard L. Conwell, Clinton L. Lingren
Publikováno v:
SPIE Proceedings.
Researchers at Digirad Corporation have developed an innovative method for eliminating the effects of hole trapping in radiation detectors made from compound semiconductors such as CdTe or CdZnTe. The technique involves no additional electronics. Wor
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0587ad8ffba3159f893d754abf62ee25
https://doi.org/10.1117/12.277670
https://doi.org/10.1117/12.277670
