Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Asad Amin Bawa"'
Autor:
Nur A. Touba, Asad Amin Bawa
Publikováno v:
2017 IEEE AUTOTESTCON.
Testing requires checking whether the output response of a circuit or system is correct or has an error. Combinational linear compactors can be used to compact the output response for a large number of scan chains into a smaller number of outputs. Wh
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 22:2017-2024
One way to organize 3-D memories is cell arrays stacked on logic where the upper die layers contain the cell arrays and the bottom layer implements the peripheral logic. A new degree of freedom exists when constructing 3-D memories, which is that the
Autor:
Asad Amin Bawa, Nur A. Touba
Publikováno v:
DFTS
Combinational linear compactors can be used to compact the output response for a large number of scan chains into a smaller number of outputs. While some compactor designs can guarantee observation of all scan chains in the presence of a small number
Publikováno v:
DFTS
A scheme is presented which uses one sequential linear decompressor to decompress test cubes and another sequential linear decompressor to decompress mask control data for masking unknown X's in the output response. However, instead of the convention
Publikováno v:
DFT
When assembling a three-dimensional integrated circuit (3D-IC), there are several degrees of freedom including which die are stacked together, in what order, and with what rotational symmetry. This paper describes strategies for exploiting these degr
Publikováno v:
VLSI-SoC
Three-dimensional (3D) technology makes it possible to organize memories as cell arrays stacked on logic where upper die layers contain the cell arrays and the bottom layer implements the peripheral logic. This creates new degrees of freedom that can
Publikováno v:
DFT
An X-Canceling MISR [Touba 07] provides the ability to tolerate unknowns (X's) in the output response with very little loss of observability of non-X values. When the density of X's is low, an X-Canceling MISR is extremely efficient as the number of
Publikováno v:
DFT
A new methodology for improving memory repair is presented which can be applied in either manufacture time repair or built-in self-repair (BISR) scenarios. In traditional memory repair, one spare column can only replace one column containing a defect