Experimental research of stability of thin films on the basis of depleted uranium as reflecting coating for wavelength of 4.5 nm

Autor: Artioukov, I.A., Chefonov, O.V., Gilev, O.N., Lipin, A.V., Ostashev, V.I., Potapov, A.V., Pronin, V.A., Svyatov, I.L., Vikhlyaev, D.A., Vinogradov, A.V.

Publikováno v: In Nuclear Inst. and Methods in Physics Research, A 2007 575(1):248-250

Structural transformations in Sc/Si multilayers irradiated by EUV lasers

Autor: Voronov, D.L., Zubarev, E.N., Pershyn, Y.P., Sevryukova, V.A., Kondratenko, V.V., Vinogradov, A.V., Artioukov, I.A., Uspenskiy, Y.A., Grisham, M., Vaschenko, G., Menoni, C.S., Rocca, J.J.

Publikováno v: Voronov, D.L.; Zubarev, E.N.; Pershyn, Y.P.; Sevryukova, V.A.; Kondratenko, V.V.; Vinogradov, A.V.; et al.(2008). Structural transformations in Sc/Si multilayers irradiated by EUV lasers. Lawrence Berkeley National Laboratory. Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/4jk2j0b4

Multilayer mirrors for the extreme ultraviolet (EUV) are key elements for numerous applications of coherent EUV sources such as new tabletop lasers and free-electron lasers. However the field of applications is limited by the radiation and thermal st

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http://www.escholarship.org/uc/item/4jk2j0b4

Determination of XUV optical constants by reflectometry using a high-repetition rate 46.9-nm laser.

Autor: Artioukov, I.A., Benware, B.R., Rocca, J.J., Forsythe, M., Uspenskii, Yu.A., Vinogradov, A.V.

Publikováno v: IEEE Journal of Selected Topics in Quantum Electronics; Nov/Dec1999, Vol. 5 Issue 6, p1495-1501, 7p

Near-wavelength resolution extreme ultraviolet imaging with a desktop-size laser.

Autor: Brizuela, F., Brewer, C., Martz, D., Marconi, M.C., Rocca, J.J., Menoni, C.S., Chao, W., Anderson, E.H., Attwood, D.T., Vinogradov, A.V., Artioukov, I.A., Ponomareko, A.G., Kondratenko, V.V.

Publikováno v: 2008 Conference on Lasers & Electro-Optics & 2008 Conference on Quantum Electronics & Laser Science; 2008, p1-2, 2p

Nanometer-scale imaging and ablation with Extreme Ultraviolet lasers.

Autor: Menoni, C.S., Brizuela, F., Brewer, C., Bravo, H., Langdon, B., Berrill, M., Martz, D., Vaschenko, G., Marconi, M.C., Rocca, J.J., Chao, W., Anderson, E.H., Attwood, D.T., Vinogradov, A.V., Artioukov, I.A., Pershyn, Y.P., Kondratenko, V.V., Hemberg, O., Frazer, B., Bloom, S.

Publikováno v: 2007 Conference on Lasers & Electro-Optics (CLEO); 2007, p1-2, 2p